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KAI-4021 Datasheet(PDF) 25 Page - ON Semiconductor

Part # KAI-4021
Description  INTERLINE CCD IMAGE SENSOR
PDF  56 Pages
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Manufacturer  ONSEMI [ON Semiconductor]
Direct Link  http://www.onsemi.com
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KAI-4021 Datasheet(HTML) 25 Page - ON Semiconductor

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KAI-4021 Image Sensor
www.truesenseimaging.com
Revision 1.1 PS-0014 Pg 25
TESTS
Dark Field Center Non-Uniformity
This test is performed under dark field conditions. Only the center 100 by 100 pixels of the sensor are used for this test
- pixel (974,974) to pixel (1073,1073).
Dark Field Center Non-Uniformity = Standard Deviation of center 100 by 100 pixels in mV
Units: mV rms
Dark Field Global Non-Uniformity
This test is performed under dark field conditions. The sensor is partitioned into 256 sub regions of interest, each of
which is 128 by 128 pixels in size. The average signal level of each of the 256 sub regions of interest is calculated. The
signal level of each of the sub regions of interest is calculated using the following formula:
Signal of ROI[i] = (ROI Average in ADU – Horizontal overclock average in ADU) * mV per count.
Where i = 1 to 256. During this calculation on the 256 sub regions of interest, the maximum and minimum signal levels
are found. The dark field global non-uniformity is then calculated as the maximum signal found minus the minimum
signal level found.
Units: mVpp (millivolts peak to peak)
Global Non-Uniformity
This test is performed with the imager illuminated to a level such that the output is at 70% of saturation
(approximately 868 mV). Prior to this test being performed the substrate voltage has been set such that the charge
capacity of the sensor is 1240 mV. Global non-uniformity is defined as


Signal
Area
Active
Deviation
Standard
Area
Active
*
100
Uniformity
-
Non
Global
Units: %rms
Active Area Signal = Active Area Average – Horizontal Overclock Average
Global Peak to Peak Non-Uniformity
This test is performed with the imager illuminated to a level such that the output is at 70% of saturation
(approximately 868 mV). Prior to this test being performed the substrate voltage has been set such that the charge
capacity of the sensor is 1240 mV. The sensor is partitioned into 256 sub regions of interest, each of which is 128 by
128 pixels in size. The average signal level of each of the 256 sub regions of interest (ROI) is calculated. The signal level
of each of the sub regions of interest is calculated using the following formula:
A[i] = (ROI Average – Horizontal Overclock Average)
Where i = 1 to 256. During this calculation on the 256 sub regions of interest, the maximum and minimum average
signal levels are found. The global peak to peak non-uniformity is then calculated as:
Signal
Area
Active
Signal
Minimum
A[i]
-
Signal
Maximum
A[i]
*
100
Uniformity
-
Non
Global
Units: %pp
Active Area Signal = Active Area Average – Horizontal Overclock Average



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