T1/E1 Short Haul Transceiver with Crystal-less Jitter Attenuation — LXT351

Datasheet

33

5.0

Test Specifications

Note:

Table 20 through Table 31 and Figure 12 through Figure 21 represent the performance

specifications of the LXT350/351 and are guaranteed by test except, where noted, by design. The

minimum and maximum values listed in Table 22 through Table 31 are guaranteed over the

recommended operating conditions specified in Table 21.

Table 20. Absolute Maximum Ratings

Parameter

Sym

Min

Max

Unit

DC supply (reference to GND)

–

6.0

V

GND - 0.3 V

V

- 10

10

mA

Storage Temperature

-65

150

° C

Caution: Exceeding these values may cause permanent damage.

Caution: Functional operation under these conditions is not implied.

Caution: Exposure to maximum rating conditions for extended periods may affect device reliability.

1. TVCC and VCC must not differ by more than 0.3 V during operation. TGND and GND must not differ by more than 0.3 V

during operation.

2. Transient currents of up to 100 mA will not cause SCR latch-up. TTIP, TRING, TVCC, and TGND can withstand continuous

currents of up to 100 mA.

Table 21. Recommended Operating Conditions

Parameter

Sym

Min

Max

Unit

Test Conditions

4.75

5.0

5.25

V

Ambient operating temperature

- 40

25

85

° C

T1

–

310

380

mW

100% mark density

–

225

295

mW

50% mark density

E1

–

275

330

mW

100% mark density

–

215

270

mW

50% mark density

1. Typical figures are at 25° C and are for design aid only; not guaranteed and not subject to production testing.

2. TVCC and VCC must not differ by more than 0.3 V.

3. Power dissipation while driving 75

Ω load over operating range for T1 operation or 60 Ω load for E1 operation. Includes

power dissipation on device and load. Digital levels are within 10% of the supply rails and digital outputs driving a 50 pF

capacitive load.