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DS2196 Datasheet(PDF) 124 Page - Dallas Semiconductor |
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DS2196 Datasheet(HTML) 124 Page - Dallas Semiconductor |
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124 / 157 page ![]() DS2196 124 of 157 20. JTAG-BOUNDARY SCAN ARCHITECTURE AND TEST ACCESS PORT 20.1DESCRIPTION The DS2196 IEEE 1149.1 design supports the standard instruction codes SAMPLE/PRELOAD, BYPASS, and EXTEST. Optional public instructions included with this design are HIGHZ, CLAMP, and IDCODE. See Figure 20-1 for a block diagram. The DS2196 contains the following items, which meet the requirements, set by the IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture. Test Access Port (TAP) TAP Controller Instruction Register Bypass Register Boundary Scan Register Device Identification Register Details on Boundary Scan Architecture and the Test Access Port can be found in IEEE 1149.1-1990, IEEE 1149.1a-1993, and IEEE 1149.1b-1994. The Test Access Port has the necessary interface pins; JTRST, JTCLK, JTMS, JTDI, and JTDO. See the pin descriptions for details. Figure 20-1: BOUNDARY SCAN ARCHITECTURE +V Boundary Scan Register Identification Register Bypass Register Instruction Register JTDI JTMS JTCLK JTRST JTDO +V +V Test Access Port Controller MUX 10K 10K 10K Select Output Enable |
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