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DLPC6421 Datasheet(PDF) 28 Page - Texas Instruments |
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DLPC6421 Datasheet(HTML) 28 Page - Texas Instruments |
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28 / 48 page ![]() 28 DLPC6421 DLPS117 – JULY 2018 www.ti.com Product Folder Links: DLPC6421 Submit Documentation Feedback Copyright © 2018, Texas Instruments Incorporated (1) Board-level pulldown resistor required. 7.2.6 Program Memory Flash The DLPC6421 controller provides an external program memory chip select: • PM_CSZ_1 – dedicated CS for boot flash device (i.e. Standard NOR-type flash, ≤ 128 Mb) The DLPC6421 controller provides enough Program Memory Address pins to support a flash device up to 128 Mb. The two most significant address bits (i.e. PM_ADDR_22 and PM_ADDR_21) are shared on pins GPIO_36 and GPIO_35 respectively. Like other GPIO pins, these pins float in a high-impedance input state following reset; therefore, if these GPIO pins are to be reconfigured as Program Memory Address pins, they require board-level pull-down resistors to prevent any flash address bits from floating until software is able to reconfigure the pins from GPIO to Program Memory Address. Also note that until software reconfigures the pins from GPIO to Program Memory Address, upper portions of flash memory are not accessible. Table 4 shows typical GPIO_35 and GPIO36 pin configuration for various flash sizes. Table 4. Typical GPIO_35 and GPIO_36 Pin Configurations for Various Flash Sizes FLASH SIZE GPIO_36 Pin Configuration GPIO_35 Pin Configuration 32 Mb or less PM_ADDR_22(1) PM_ADDR_21(1) 64 Mb 128 Mb 7.2.7 Calibration and Debug Support The DLPC6421 controller contains a test point output port, TSTPT_(7:0), which provides selected system calibration support as well as debug support. These test points are inputs while reset is applied and switch to outputs when reset is released. The state of these signals is sampled upon the release of system reset and the captured value configures the test mode until the next time reset is applied. Each test point includes an internal pull-down resistor and thus external pull-ups are used to modify the default test configuration. The default configuration (x00) corresponds to the TSTPT_(7:0) outputs being driven low for reduce switching activity during normal operation. For maximum flexibility, an option to jumper to an external pull-up is recommended for TSTPT_(3:0). Note that adding pull-up to TSTPT_(7:4) may have adverse affects for normal operation and are not recommended. Note that these external pull-ups are only sampled upon a zero to one transition on POSENSE and thus changing their configuration after reset has been released will not have any effect until the next time reset is asserted and released. Table 5 defines the test mode selection for 3 of the 16 programmable scenarios defined by TSTPT_(3:0), if a test mode is not selected the system will output the default configuration listed under Default Software Configuration. Table 5. Test Mode Selection No Switching Activity System Calibration ARM Debug Signal Set Default Software Configuration TSTPT(3:0) Capture Value x0 x8 x1 N/A TSTPT(0) 0 Vertical Sync ARM9_Debug (0) User Configurable (Default: VSYNC) TSTPT(1) 0 Delayed CW Index ARM9_Debug (1) User Configurable TSTPT(2) 0 Sequence Index ARM9_Debug (2) User Configurable TSTPT(3) 0 CW Spoke Test Pt ARM9_Debug (3) User Configurable (Default: Sequence index) TSTPT(4) 0 CW Revolution Test Pt ARM9_Debug (4) User Configurable TSTPT(5) 0 Reset Seq. Aux Bit 0 ARM9_Debug (5) User Configurable TSTPT(6) 0 Reset Seq. Aux Bit 1 ARM9_Debug (6) Reserved TSTPT(7) 0 Reset Seq. Aux Bit 2 ARM9_Debug (7) User Configurable |
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