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DLPC6421 Datasheet(PDF) 28 Page - Texas Instruments

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Part # DLPC6421
Description  DLP Display Controller
PDF  48 Pages
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

DLPC6421 Datasheet(HTML) 28 Page - Texas Instruments

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DLPC6421
DLPS117 – JULY 2018
www.ti.com
Product Folder Links: DLPC6421
Submit Documentation Feedback
Copyright © 2018, Texas Instruments Incorporated
(1)
Board-level pulldown resistor required.
7.2.6 Program Memory Flash
The DLPC6421 controller provides an external program memory chip select:
•
PM_CSZ_1 – dedicated CS for boot flash device (i.e. Standard NOR-type flash,
≤ 128 Mb)
The DLPC6421 controller provides enough Program Memory Address pins to support a flash device up to 128
Mb. The two most significant address bits (i.e. PM_ADDR_22 and PM_ADDR_21) are shared on pins GPIO_36
and GPIO_35 respectively. Like other GPIO pins, these pins float in a high-impedance input state following reset;
therefore, if these GPIO pins are to be reconfigured as Program Memory Address pins, they require board-level
pull-down resistors to prevent any flash address bits from floating until software is able to reconfigure the pins
from GPIO to Program Memory Address. Also note that until software reconfigures the pins from GPIO to
Program Memory Address, upper portions of flash memory are not accessible.
Table 4 shows typical GPIO_35 and GPIO36 pin configuration for various flash sizes.
Table 4. Typical GPIO_35 and GPIO_36 Pin Configurations for Various Flash Sizes
FLASH SIZE
GPIO_36 Pin Configuration
GPIO_35 Pin Configuration
32 Mb or less
PM_ADDR_22(1)
PM_ADDR_21(1)
64 Mb
128 Mb
7.2.7 Calibration and Debug Support
The DLPC6421 controller contains a test point output port, TSTPT_(7:0), which provides selected system
calibration support as well as debug support. These test points are inputs while reset is applied and switch to
outputs when reset is released. The state of these signals is sampled upon the release of system reset and the
captured value configures the test mode until the next time reset is applied. Each test point includes an internal
pull-down resistor and thus external pull-ups are used to modify the default test configuration. The default
configuration (x00) corresponds to the TSTPT_(7:0) outputs being driven low for reduce switching activity during
normal operation. For maximum flexibility, an option to jumper to an external pull-up is recommended for
TSTPT_(3:0). Note that adding pull-up to TSTPT_(7:4) may have adverse affects for normal operation and are
not recommended. Note that these external pull-ups are only sampled upon a zero to one transition on
POSENSE and thus changing their configuration after reset has been released will not have any effect until the
next time reset is asserted and released. Table 5 defines the test mode selection for 3 of the 16 programmable
scenarios defined by TSTPT_(3:0), if a test mode is not selected the system will output the default configuration
listed under Default Software Configuration.
Table 5. Test Mode Selection
No Switching
Activity
System
Calibration
ARM Debug Signal Set
Default Software Configuration
TSTPT(3:0)
Capture Value
x0
x8
x1
N/A
TSTPT(0)
0
Vertical Sync
ARM9_Debug (0)
User Configurable (Default: VSYNC)
TSTPT(1)
0
Delayed CW
Index
ARM9_Debug (1)
User Configurable
TSTPT(2)
0
Sequence Index
ARM9_Debug (2)
User Configurable
TSTPT(3)
0
CW Spoke Test
Pt
ARM9_Debug (3)
User Configurable (Default: Sequence index)
TSTPT(4)
0
CW Revolution
Test Pt
ARM9_Debug (4)
User Configurable
TSTPT(5)
0
Reset Seq. Aux
Bit 0
ARM9_Debug (5)
User Configurable
TSTPT(6)
0
Reset Seq. Aux
Bit 1
ARM9_Debug (6)
Reserved
TSTPT(7)
0
Reset Seq. Aux
Bit 2
ARM9_Debug (7)
User Configurable



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