TMP1827 datasheet(6/68 Pages) TI

6 / 68 page

Over free-air temperature range and VDD = 1.7 V to 5.5 V (unless otherwise noted); Typical specifications are at TA = 25 °C

and VDD = 3.3 V (unless otherwise noted)

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

tDELAY

Start-up delay for temperature

conversion and EEPROM

programming

100

300

µs

SDQ DIGITAL INPUT/OUTPUT

CIN

SDQ pin capacitance

VIL

Input logic low level(3)

–0.3

0.2 × VS

VIH

Input logic high level(3)

0.8 × VS

VS + 0.3

VHYST

Hysteresis

0.3

IIN

Input leakage current

±0.5

TBD

μA

VOL

Output low level

IOL = –4 mA

0.4

GPIO CHARACTERISTICS

CIN

Input capacitance

VIL

Input logic low level(3)

–0.3

0.2 × VS

VIH

Input logic high level(3)

0.8 × VS

VS + 0.3

IIN

Input leakage current

±0.1

µA

VHYST

Hysteresis

0.175

VOL

Output low level

IOL = –4 mA

0.4

RESISTOR ADDRESS DECODER CHARACTERISTICS

CLOAD

Load capacitance as seen

on ADDR pin (includes PCB

parasitics)

100

RADDR resistor range

6.49

54.9

kΩ

RADDR resistor tolerance

TA = 25°C

–1.0

1.0

RADDR resistor temperature

coefficient

–100

100 ppm/°C

RADDR resistor lifetime drift

–0.2

0.2

tRESDET

Resistor decoding time

2.8

POWER SUPPLY

IPU

Pullup current(4)

Bus powered mode, serial bus inactive

300

μA

IDD_ACTIVE

Supply current during

temperature conversion

Temperature Conversion, serial bus inactive

TBD

μA

IDD_SB

Standby current(5)

VDD powered, serial

bus inactive, continous

conversion mode

TA = -55°C to 85°C

1.59

TBD

μA

TA = -55°C to 150°C

TBD

IDD_SD

Shutdown current

Serial bus inactive, one

shot conversion mode

TA = -55°C to 85°C

1.01

TBD

μA

TA = -55°C to 150°C

TBD

VPOR

Power-on reset threshold

voltage

Supply rising (Figure 7-4, Figure 7-5)

1.5

Brownout detect

Supply falling

1.3

tINIT

Reset Initialization Time

Time required by device to reset after power up

(Figure 7-4, Figure 7-5)

2.0

(1)

Repeatability is the ability to reproduce a reading when the measured temperature is applied consecutively, under the same conditions.

See Figure 7-11

(2)

Long term stability is determined using accelerated operational life testing at a junction temperature of 150°C.

(3)

In bus powered mode VS = VPUR. In supply powered mode VS = VDD.

(4)

The pullup current parameter is required to size the bus pullup resistor (See Section 8.3.3) for active temperature conversion or

EEPROM read and program or authentication operations.

(5)

Quiescent current between conversions.

TMP1827

SBOSA15 – SEPTEMBER 2022

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