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ST25R3916 Datasheet(PDF) 66 Page - STMicroelectronics |
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ST25R3916 Datasheet(HTML) 66 Page - STMicroelectronics |
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66 / 157 page  Application information ST25R3916/7 66/157 DS12484 Rev 4 4.4.17 Test access The devices do not have dedicated test pins. A direct command Test Access is used to enable RW access of test registers and entry in different test modes. Pins CSI and CSO are used as test pins. Test mode entry and access to test registers Test registers are not part of the normal register address space. After sending direct command Test Access, test registers can be accessed using normal Read/Write register command. Access to test registers is possible in a chained command sequence where command Test Access is sent first, followed by read/write access to test registers using auto increment feature. Test register are set to default state at power-up. Analog test and observation register 1 Address: 01h Type: RW Table 15. Analog test and observation register 1 Bit Name Default Function Comments 7 tana7 0 - Reserved 6 tana6 1 - Reserved 5 tana5 0 - Reserved 4- 0 - Reserved 5 tana3 0 See Table 16 These test modes are also intended for observation in normal mode. Other modes of this register are also available when analog test mode is not set. 4 tana2 0 3 tana1 0 0 tana0 0 Table 16. Test access register - Signal selection of CSI and CSO pins tana3:0 (hex) Pin CSI Pin CSO Type Functionality Type Functionality Comment 1A0 Analog output of AM channel (before digitizer) D0 Digital output of AM channel (after digitizer) Normal operation (reader) 2A0 Analog output of PM channel (before digitizer) D0 Digital output of PM channel (after digitizer) 3A0 Analog output of AM channel (before digitizer) A0 Analog output of PM channel (before digitizer) 4A0 Analog output of AM correlation signal A0 Analog output of PM correlation signal 5A0 Tag demodulator analog D0 Tag demodulator OOK digital out Normal operation (tag) 6A0 D0 Tag demodulator ASK digital out |
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