Data Sheet

ADXL314

SPECIFICATIONS

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Rev. A | 4 of 27

Table 1. Specifications

Parameter

Test Conditions/Comments

Min1

Typ2

Max1

Unit

TEMPERATURE (T)

Operating Temperature Range

−40

+125

°C

1 Minimum and maximum specifications represent the worst case of mean ± 3 σ distribution and are guaranteed in production.

2 Typical specifications are for at least 68% of the population of parts and are based on the worst case of mean ± 1 σ distribution, except for sensitivity, which represents the

target value.

3 Cross-axis sensitivity is defined as coupling between any two axes.

4 The output format for the 1600 Hz and 3200 Hz output data rates is different from the output format for the other output data rates. For more information, see the Data

Formatting at Output Data Rate of 3200 Hz and 1600 Hz section.

5 Bandwidth is the −3 dB frequency and is half the output data rate: bandwidth = ODR/2.

6 Self test change is defined as the output (g) when the SELF_TEST bit = 1 (DATA_FORMAT register, Address 0x31) minus the output (g) when the SELF_TEST bit = 0. Due

to device filtering, the output reaches its final value after 4 × τ when enabling or disabling self test, where τ = 1/(data rate). For the self test to operate correctly, the device

must be in normal power operation (LOW_POWER bit = 0 in the BW_RATE register, Address 0x2C).

7 The turn-on time and wake-up time are determined by the user-defined bandwidth. At a 100 Hz data rate, the turn-on time and wake-up time are each approximately 11.1

ms. For other data rates, the turn-on time and wake-up time are each approximately τ + 1.1 ms, where τ = 1/(data rate).