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ADXL314 Datasheet(PDF) 3 Page - Analog Devices

Part # ADXL314
Description  ±200 g Range, 3-Axis Digital Accelerometer
PDF  27 Pages
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Manufacturer  AD [Analog Devices]
Direct Link  http://www.analog.com
Logo AD - Analog Devices

ADXL314 Datasheet(HTML) 3 Page - Analog Devices

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Data Sheet
ADXL314
SPECIFICATIONS
analog.com
Rev. A | 3 of 27
TA = 25°C, VS = 2.5 V, VDD I/O = 2.5 V, acceleration = 0 g, VS capacitance (CVS) = 1 μF tantalum, VDD I/O capacitance (CVDDI/O) = 0.1 μF, and
ODR = 100 Hz, unless otherwise noted.
Table 1. Specifications
Parameter
Test Conditions/Comments
Min1
Typ2
Max1
Unit
SENSOR INPUT
Each axis
Measurement Range
±200
g
Nonlinearity
Percentage of full scale
±0.5
%
Cross-Axis Sensitivity3
±2.5
%
Sensor Resonant Frequency
16
kHz
OUTPUT RESOLUTION
Each axis
All Operation Modes
13
Bits
SENSITIVITY
All axes
Sensitivity
ODR = 100 Hz
20.48
LSB/g
Scale Factor
ODR = 100 Hz
48.83
mg/LSB
Scale Factor Calibration Error
±10
%
Sensitivity Change due to Temperature
−40°C ≥ TA ≤ +25°C or +25°C ≥ TA ≤ +125°C
8
%
0 g OFFSET
0 g Output
X-axis and Y-axis
−7
±1
+7
g
Z-axis
−7
±3
+7
g
0 g Offset Change due to Temperature
−40°C to +105°C
±20
mg/°C
105°C to +125°C
±100
mg/°C
NOISE PERFORMANCE (RMS)
Noise Density
X-Axis and Y-Axis
5.65
mg/√Hz
Z-Axis
6.8
mg/√Hz
Noise Density Change with Temperature (All Axes)
0.5
mg/√Hz/°C
OUTPUT DATA RATE AND BANDWIDTH4, 5
User-selectable
Measurement Rate
6.25
3200
Hz
SELF TEST6
Z-axis only
Self Test Change
At 100 Hz ODR, −40°C ≥ TA ≤ +125°C
0.1
4
8
g
Self Test Change vs. Temperature
−12.5
mg/°C
POWER SUPPLY
Operating Voltage Range (VS)
2.0
3.6
V
Interface Voltage Range (VDD I/O)
2.0
VS
V
Supply Current
Measurement Mode
ODR ≥ 100 Hz, −40°C to +125°C
70
170
µA
ODR ≤ 10 Hz, −40°C to +125°C
20
50
µA
Low Power Mode
ODR = 100 Hz, −40°C to +125°C
22
65
µA
Standby Mode
25°C
0.1
µA
−40°C to 125°C
17
µA
Turn-On and Wake-up Time7
1.4
ms



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