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RT600 Datasheet(PDF) 145 Page - NXP Semiconductors |
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RT600 Datasheet(HTML) 145 Page - NXP Semiconductors |
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145 / 171 page ![]() RT600 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors B.V. 2024. All rights reserved. Product data sheet Rev. 2.2 — 25 January 2024 145 of 173 NXP Semiconductors RT600 Dual-core microcontroller with 32-bit Cortex-M33 and Xtensa HiFi4 Audio DSP CPUs The internal pull-up (1.5 k) can be enabled by setting the DCON bit in the DEVCMDSTAT register to prevent the USB from timing out when there is a significant delay between power-up and handling USB traffic. External circuitry is not required. 16.7 Boundary Scan Mode The RESET pin selects between the JTAG boundary scan (RESET = LOW) and the Arm SWD debug (RESET = HIGH). The Arm SWD debug port is disabled while the RT6xx is in reset. The JTAG boundary scan pins are selected by hardware when the part is in boundary scan mode. To perform boundary scan testing, follow these steps: 1. Power up the part with the RESET pin pulled LOW externally. Fig 37. USB interface on a self-powered device where USB_VBUS = 5 V RTxxx USB1_VDD3V3 R1 1.5 kΩ aaa-023996 USB-B connector USB_DP USB_DM USB_VBUS VSS RS = 33 Ω RS = 33 Ω USB D+ D- Two options exist for connecting VBUS to the USB_VBUS pin: (1) Connect the regulator output to USB_VBUS. In this case, the USB_VBUS signal is HIGH whenever the part is powered. (2) Connect the VBUS signal directly from the connector to the USB_VBUS pin. In this case, 5 V are applied to the USB_VBUS pin while the regulator is ramping up to supply USB1_VDD3V3. Fig 38. USB interface on a bus-powered device REGULATOR VBUS RTxxx USB1_VDD3V3 R1 1.5 kΩ aaa-023997 USB-B connector USB_DP USB_DM VSS USB_VBUS(2) USB_VBUS(1) USB D- RS = 33 Ω RS = 33 Ω D+ |
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