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RF226AP Datasheet(PDF) 39 Page - NXP Semiconductors

Part # RF226AP
Description  RF112L0H Transceiver Data Sheet
PDF  46 Pages
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Manufacturer  NXP [NXP Semiconductors]
Direct Link  http://www.nxp.com
Logo NXP - NXP Semiconductors

RF226AP Datasheet(HTML) 39 Page - NXP Semiconductors

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Table 14. Start-up specification
Parameter
Conditions
Min
Typ
Max
Unit
Minimum reset time Crystal oscillator
2
ms
Maximum DLL
calibration time
700
μs
Upon power-up and release from reset, the chip has its 160 MHz differential clock IO
buffer tri-stated. It has the internal crystal oscillator enabled to generate a 40 MHz clock,
and that clock is driven to internal components to allow configuration via the I2C and/or
the LLCP interfaces.
The firmware download and further configuration are possible over either the I2C or
LLCP (running at 100 Mbps) interfaces.
After firmware download and a command to calibrate the DLL, the completion of
calibration is reported in a register that can be polled over the LLCP or I2C interfaces.
The 160 MHz differential clock IO output can be enabled with a firmware command over
the LLCP or I2C interfaces subsequent to DLL calibration.
3.9 Specification of auxiliary functions
3.9.1 Auxiliary ADC
The auxiliary ADC will be used for internal calibration and during test.
Internal signals are routed to the AUX ADC via the analog test bus.
External signals are can be applied to the AUX ADC via the ATEST1 to ATEST4 pins,
without using the analog testbus. The AUX ADC MUX has inputs directly connected to
the ATEST pads. Both single-ended and differential external signals can be connected to
the AUX ADC.
This table shows an auxiliary ADC specification.
Table 15. Auxiliary ADC specification
Parameter
Conditions
Min
Typ
Max
Unit
Conversion time
per sample
11 bits, 20 MHz
internal ADC clock
0.6
1.0
µs
Table continues on the next page...
Electrical characteristics
RF112L0H Transceiver Data Sheet, Rev. A, 12/2020
NXP Semiconductors
Preliminary
39
Confidential Proprietary



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