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XRT86VL32IB Datasheet(PDF) 33 Page - Exar Corporation |
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XRT86VL32IB Datasheet(HTML) 33 Page - Exar Corporation |
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33 / 65 page ![]() XRT86VL32 30 REV. V1.2.0 DUAL T1/E1/J1 FRAMER/LIU COMBO - HARDWARE DESCRIPTION JTAG INTERFACE The XRT86VL32 device’s JTAG features comply with the IEEE 1149.1 standard. Please refer to the industry specification for additional information on boundary scan operations. SIGNAL NAME BALL # TYPE OUTPUT DRIVE (MA) DESCRIPTION TCK C7 I - Test clock: Boundary Scan Test clock input: The TCLK signal is the clock for the TAP controller, and it generates the boundary scan data register clocking. The data on TMS and TDI is loaded on the positive edge of TCK. Data is observed at TDO on the falling edge of TCK. TMS C6 I - Test Mode Select: Boundary Scan Test Mode Select input. The TMS signal controls the transitions of the TAP controller in conjunction with the rising edge of the test clock (TCK). NOTE: For normal operation this pin MUST be pulled "High". TDI B6 I - Test Data In: Boundary Scan Test data input The TDI signal is the serial test data input. NOTE: This pin is internally pulled ’high’. TDO D5 O 8 Test Data Out: Boundary Scan Test data output The TDO signal is the serial test data output. TRST A6 I - Test Reset Input: The TRST signal (Active Low) asynchronously resets the TAP controller to the Test-Logic-Reset state. NOTE: This pin is internally pulled ’high’ TESTMODE B11 I - Factory Test Mode Pin NOTE: This pin is internally pulled ’low’, and should be pulled ’low’ for normal operation. aTESTMODE B5 I - Factory Test Mode Pin NOTE: This pin is internally pulled ’low’, and should be pulled ’low’ for normal operation. ATP_Ring B2 I - ATP_Ring Test Pin This analog test pin is used for testing the continuity between the TTIP/TRING, RTIP/RRING of each channel and the on- board transformer. ATP_Tip C3 I - ATP_Tip Test Pin This analog test pin is used for testing the continuity between the TTIP/TRING, RTIP/RRING of each channel and the on- board transformer. |
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