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28F008B3 Datasheet(PDF) 33 Page - Intel Corporation |
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28F008B3 Datasheet(HTML) 33 Page - Intel Corporation |
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33 / 49 page ![]() E SMART 3 ADVANCED BOOT BLOCK–BYTE-WIDE 33 PRELIMINARY TEST POINTS INPUT OUTPUT V CCQ 0.0 V CCQ 2 V CCQ 2 0605-011 NOTE: AC test inputs are driven at VCCQ for a logic “1” and 0.0V for a logic “0.” Input timing begins, and output timing ends, at VCCQ/2. Input rise and fall times (10%–90%) <10 ns. Worst case speed conditions are when VCCQ=2.7V. Figure 10. 2.7V–3.6V Input Range and Measurement Points C L Out V CCQ Device under Test R 1 R 2 0605-012 NOTE: See table for component values. Figure 11. Test Configuration Test Configuration Component Values for Worst Case Speed Conditions Test Configuration CL (pF) R1 ( Ω)R2 (Ω) 2.7V Standard Test 50 25K 25K |
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