28F008B3 datasheet(37/49 Pages) INTEL

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SMART 3 ADVANCED BOOT BLOCK–BYTE-WIDE

PRELIMINARY

Table 13. DC Characteristics: VCCQ = 1.8V–2.2V (Continued)

Sym

Parameter

Notes

VCC1:

2.7V–2.85V

VCC2:

2.7V–3.3V

Unit

Test Conditions

Typ

Max

VIL

Input Low Voltage

–0.2

0.2

VIH

Input High Voltage

VCCQ –

0.2V

VOL

Output Low Voltage

–0.10

0.10

VCC = VCCMin

VCCQ = VCCQMin

IOL = 100 µA

VOH

Output High Voltage

VCCQ –

0.1V

VCC = VCCMin

VCCQ = VCCQMin

IOH = –100 µA

VPPLK VPP Lock-Out Voltage

1.5

Complete Write Protection

VPPH1 VPP during Prog./Erase

Operations

2.7

2.85

VPPH2

2.7

3.3

VPPH3

3,6

11.4

12.6

VLKO1 VCC Program/Erase Lock

Voltage

1.5

VLKO2 VCCQ Program/Erase

Lock Voltage

1.2

NOTES:

All currents are in RMS unless otherwise noted. Typical values at nominal VCC, TA = +25°C.

ICCES and ICCWS are specified with device de-selected. If device is read while in erase suspend, current draw is ICCR. If the

device is read while in program suspend, current draw is ICCR.

Erases and Writes inhibited when VPP < VPPLK, and not guaranteed outside the valid VPP ranges of VPPH1,VPPH2. or VPPH3.

Sampled, not 100% tested.

Automatic Power Savings (APS) reduces ICCR to approximately standby levels in static operation (CMOS inputs).

Applying VPP = 11.4V–12.6V during program/erase can only be done for a maximum of 1000 cycles on the main blocks

and 2500 cycles on the parameter blocks. VPP may be connected to 12V for a total of 80 hours maximum. See Section 3.4

for details.

Includes the sum of VCC and VCCQ current

Table 14. Capacitance (TA = 25°C, f = 1 MHz)

Sym

Parameter

Notes

Typ

Max

Units

Conditions

CIN

Input Capacitance

VIN = 0V

COUT

Output Capacitance

VOUT = 0V

NOTE:

Sampled, not 100% tested.

28F008B3 Datasheet(PDF) 37 Page - Intel Corporation

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