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DS2155 Datasheet(PDF) 228 Page - Dallas Semiconductor |
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DS2155 Datasheet(HTML) 228 Page - Dallas Semiconductor |
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228 / 262 page ![]() DS2156 228 of 262 Table 33-A. Instruction Codes for IEEE 1149.1 Architecture INSTRUCTION SELECTED REGISTER INSTRUCTION CODES SAMPLE/PRELOAD Boundary Scan 010 BYPASS Bypass 111 EXTEST Boundary Scan 000 CLAMP Bypass 011 HIGHZ Bypass 100 IDCODE Device Identification 001 SAMPLE/PRELOAD This is a mandatory instruction for the IEEE 1149.1 specification that supports two functions. The digital I/Os of the device can be sampled at the boundary scan register without interfering with the normal operation of the device by using the Capture-DR state. SAMPLE/PRELOAD also allows the device to shift data into the boundary scan register through JTDI using the Shift-DR state. BYPASS When the BYPASS instruction is latched into the parallel instruction register, JTDI connects to JTDO through the 1-bit bypass test register. This allows data to pass from JTDI to JTDO without affecting the device’s normal operation. EXTEST This allows testing of all interconnections to the device. When the EXTEST instruction is latched in the instruction register, the following actions occur: Once enabled through the Update-IR state, the parallel outputs of all digital output pins are driven. The boundary scan register is connected between JTDI and JTDO. The Capture-DR samples all digital inputs into the boundary scan register. CLAMP All digital outputs of the device output data from the boundary scan parallel output while connecting the bypass register between JTDI and JTDO. The outputs do not change during the CLAMP instruction. HIGHZ All digital outputs of the device are placed in a high-impedance state. The BYPASS register is connected between JTDI and JTDO. IDCODE When the IDCODE instruction is latched into the parallel instruction register, the identification test register is selected. The device identification code is loaded into the identification register on the rising edge of JTCLK following entry into the Capture-DR state. Shift-DR can be used to shift the identification code out serially through JTDO. During Test-Logic-Reset, the identification code is forced into the instruction register’s parallel output. The ID code always has a 1 in the LSB position. The next 11 bits identify the manufacturer’s JEDEC number and number of continuation bytes followed by 16 bits for the device and 4 bits for the version (Table 33-B). Table 33-C lists the device ID codes for the SCT devices. |
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