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DS2155 Datasheet(PDF) 224 Page - Dallas Semiconductor |
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DS2155 Datasheet(HTML) 224 Page - Dallas Semiconductor |
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224 / 262 page ![]() DS2156 224 of 262 33. JTAG BOUNDARY SCAN ARCHITECTURE AND TEST ACCESS PORT 33.1 Description The DS2156 IEEE 1149.1 design supports the standard instruction codes SAMPLE/PRELOAD, BYPASS, and EXTEST. Optional public instructions included are HIGH-Z, CLAMP, and IDCODE (Figure 33-1.). The DS2156 contains the following features as required by IEEE 1149.1 standard test access port (TAP) and boundary scan architecture. § Test Access Port § TAP Controller § Instruction Register § Bypass Register § Boundary Scan Register § Device Identification Register The DS2156 is pin-compatible with the DS2152, DS21x52 (T1) and DS2154, DS21x54 (E1) SCT families. The JTAG feature uses pins that had no function in the DS2152 and DS2154. Details about boundary scan architecture and the TAP are in IEEE 1149.1-1990, IEEE 1149.1a-1993, and IEEE 1149.1b-1994. The TAP contains the necessary interface pins JTRST, JTCLK, JTMS, JTDI, and JTDO. See the pin descriptions in Section 3 for details. Figure 33-1. JTAG Functional Block Diagram +V BOUNDARY SCAN REGISTER IDENTIFICATION REGISTER BYPASS REGISTER INSTRUCTION REGISTER JTDI JTMS JTCLK JTRST JTDO +V +V TEST ACCESS PORT CONTROLLER MUX 10kΩ 10kΩ 10kΩ SELECT OUTPUT ENABLE |
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