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DS2155 Datasheet(PDF) 224 Page - Dallas Semiconductor

Part # DS2155
Description  T1/E1/J1 Single-Chip Transceiver TDM/UTOPIA II Interface
PDF  262 Pages
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Manufacturer  DALLAS [Dallas Semiconductor]
Direct Link  https://www.maximintegrated.com/en.html
Logo DALLAS - Dallas Semiconductor

DS2155 Datasheet(HTML) 224 Page - Dallas Semiconductor

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DS2156
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33.
JTAG BOUNDARY SCAN ARCHITECTURE AND TEST ACCESS PORT
33.1 Description
The DS2156 IEEE 1149.1 design supports the standard instruction codes SAMPLE/PRELOAD,
BYPASS, and EXTEST. Optional public instructions included are HIGH-Z, CLAMP, and IDCODE
(Figure 33-1.). The DS2156 contains the following features as required by IEEE 1149.1 standard test
access port (TAP) and boundary scan architecture.
§ Test Access Port
§ TAP Controller
§ Instruction Register
§ Bypass Register
§ Boundary Scan Register
§ Device Identification Register
The DS2156 is pin-compatible with the DS2152, DS21x52 (T1) and DS2154, DS21x54 (E1) SCT
families. The JTAG feature uses pins that had no function in the DS2152 and DS2154. Details about
boundary scan architecture and the TAP are in IEEE 1149.1-1990, IEEE 1149.1a-1993, and IEEE
1149.1b-1994.
The TAP contains the necessary interface pins JTRST, JTCLK, JTMS, JTDI, and JTDO. See the pin
descriptions in Section 3 for details.
Figure 33-1. JTAG Functional Block Diagram
+V
BOUNDARY SCAN
REGISTER
IDENTIFICATION
REGISTER
BYPASS
REGISTER
INSTRUCTION
REGISTER
JTDI
JTMS
JTCLK
JTRST
JTDO
+V
+V
TEST ACCESS PORT
CONTROLLER
MUX
10kΩ
10kΩ
10kΩ
SELECT
OUTPUT ENABLE



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