AD9653 datasheet(26/42 Pages) AD

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Data Sheet

AD9653

Rev. E | Page 25 of 41

–8

–40

TEMPERATURE (°C)

–6

–4

–2

–15

Figure 60. Typical VREF = 1.0 V Drift

–15

–10

–5

–40

–20

TEMPERATURE (°C)

Figure 61. Typical VREF = 1.3 V Drift

When the SENSE pin is tied to AVDD, the internal reference is

disabled, allowing the use of an external reference. An internal

reference buffer loads the external reference with an equivalent

7.5 kΩ load (see Figure 50). The internal buffer generates the

positive and negative full-scale references for the ADC core.

It is not recommended to leave the SENSE pin floating.

CLOCK INPUT CONSIDERATIONS

For optimum performance, clock the AD9653 sample clock inputs,

CLK+ and CLK−, with a differential signal. The signal is typically

ac-coupled into the CLK+ and CLK− pins via a transformer or

capacitors. These pins are biased internally (see Figure 44) and

require no external bias.

Clock Input Options

The AD9653 has a flexible clock input structure. The clock input

can be a CMOS, LVDS, LVPECL, or sine wave signal. Regard-

less of the type of signal being used, clock source jitter is of the

most concern, as described in the Jitter Considerations section.

Figure 62 and Figure 63 show two preferred methods for clock-

ing the AD9653 (at clock rates up to 1 GHz prior to internal clock

divider). A low jitter clock source is converted from a single-

ended signal to a differential signal using either a radio frequency

(RF) transformer or an RF balun.

The RF balun configuration is recommended for clock frequencies

between 125 MHz and 1 GHz, and the RF transformer is recom-

mended for clock frequencies from 20 MHz to 200 MHz. The

antiparallel Schottky diodes across the transformer/balun

secondary winding limit clock excursions into the AD9653 to

approximately 0.8 V p-p differential.

This limit helps prevent the large voltage swings of the clock

from feeding through to other portions of the AD9653 while

preserving the fast rise and fall times of the signal that are critical

to achieving low jitter performance. However, the diode capaci-

tance comes into play at frequencies above 500 MHz. Care must be

taken in choosing the appropriate signal limiting diode.

0.1µF

SCHOTTKY

DIODES:

HSMS2822

CLOCK

INPUT

50Ω

100Ω

CLK–

CLK+

ADC

Mini-Circuits®

ADT1-1WT, 1:1 Z

XFMR

Figure 62. Transformer-Coupled Differential Clock (Up to 200 MHz)

0.1µF

CLOCK

INPUT

0.1µF

50Ω

CLK–

CLK+

SCHOTTKY

DIODES:

HSMS2822

ADC

Figure 63. Balun-Coupled Differential Clock (Up to 1 GHz)

If a low jitter clock source is not available, another option is to

ac couple a differential PECL signal to the sample clock input

pins, as shown in Figure 64. The AD9510/AD9511/AD9512/

AD9513/AD9514/AD9515/AD9516-4/AD9517-4 clock drivers

offer excellent jitter performance.

A third option is to ac couple a differential LVDS signal to the

sample clock input pins, as shown in Figure 65. The AD9510/

AD9511/AD9512/AD9513/AD9514/AD9515/AD9516-4/

AD9517-4 clock drivers offer excellent jitter performance.

In some applications, it may be acceptable to drive the sample

clock inputs with a single-ended 1.8 V CMOS signal. In such

applications, drive the CLK+ pin directly from a CMOS gate, and

bypass the CLK− pin to ground with a 0.1 μF capacitor (see

Figure 66).

0Ω

0.1µF

240Ω

50kΩ

CLK–

CLK+

CLOCK

INPUT

CLOCK

INPUT

ADC

AD951x

PECL DRIVER

Figure 64. Differential PECL Sample Clock (Up to 1 GHz)

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