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DS3182 Datasheet(PDF) 22 Page - Maxim Integrated Products |
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DS3182 Datasheet(HTML) 22 Page - Maxim Integrated Products |
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22 / 389 page ![]() DS3181/DS3182/DS3183/DS3184 22 of 38 9 · Subrate operation for each channel is totally independent from the other channels’ operation, i.e. all subrate functions within the device are mutually exclusive · Three distinct subrate algorithms: · (FFRAC) Externally controlled with DS3 or E3 payload manipulating capability · (XFRAC) Externally controlled with flexible DS3 or E3 data rate reduction capability · (IFRAC) Internally controlled with simple DS3 or E3 data rate reduction capability · Subrate algorithm selection is on per-port basis · Internal subrate mechanism allows down to bit-level granularity of the DS3 or E3 payload 3.25 Test Features · Five pin JTAG port · All functional pins are in/out pins in JTAG mode · Standard JTAG instructions: SAMPLE/PRELOAD, BYPASS, EXTEST, CLAMP, HIGHZ, IDCODE · RAM BIST on all internal RAM · High-Z pin to force all digital output and in/out pins into HIZ · TEST pin for manufacturing scan test modes |
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