TSC2014IYZGR datasheet(45/62 Pages) TI2

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TSC2014

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SBAS484B – SEPTEMBER 2010 – REVISED DECEMBER 2016

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7.6.4.2 Configuration Register 1

Configuration register 1 (CFR1) defines the connection test-bit modes configuration and batch delay selection.

Figure 40. Configuration Register 1 (Reset Value = 0000h)

MSB

D15

D14

D13

D12

D11

D10

LSB

Resrv

TBM3

TBM2

TBM1

TBM0

Resrvd

BTD2

BTD1

BTD0

7.6.4.2.1

TBM3-TBM0

Connection test-bit modes (patent pending). These bits specify the mode of test bits used for the predefined

range of the combined X-axis and Y-axis touch screen panel resistance (RTS).

Table 18. Touch Screen Resistance Range and Test-Bit Modes

TEST-BIT MODES

RTS

Ω)

TBM3

TBM2

TBM1

TBM0

0.17

0.17 < RTS ≤ 0.52

0.52 < RTS ≤ 0.86

0.86 < RTS ≤ 1.6

1.6 < RTS ≤ 2.2

2.2 < RTS ≤ 3.6

3.6 < RTS ≤ 5.0

5.0 < RTS ≤ 7.8

7.8 < RTS ≤ 10.5

10.5 < RTS ≤ 16.0

16.0 < RTS ≤ 21.6

21.6 < RTS ≤ 32.6

Reserved

Only for short-circuit panel test

7.6.4.2.2

BTD2-BTD0

Batch Time Delay mode. These are the selection bits that specify the delay before a sample/conversion scan

cycle is triggered. When it is set, Batch Time Delay mode uses a set of timers to automatically trigger a

sequence of sample-and-conversion events. The mode works for both TSC-initiated scans (XYZ or XY) and host-

initiated scans (XYZ or XY).

A TSC-initiated scan (XYZ or XY) can be configured by setting the PSM bit in CFR0 to '1' and C[3:0] in Control

Byte 1 to '0000' or '0001'. In the case of a TSC-initiated scan (XYZ or XY), the sequence begins with the TSC

responding to a pen touch. After the first processed sample set completes during the batch delay, the scan

enters a wait mode until the end of the batch delay is reached. If a pen touch is still detected at that moment, the

scan continues to process the next sample set, and the batch delay is resumed. The throughput of the processed

sample sets (shown in Table 19 as sample sets per second, or SSPS) is regulated by the selected batch delay

during the time of the detected pen touch. A TSC-initiated scan (XYZ or XY) can be configured by setting the

PSM bit in CFR0 to '1' and C[3:0] in Control Byte 1 to '0000' or '0001'. Note that the throughput of the processed

sample set also depends on the settings of stabilization, precharge, and sense times, and the total number of

samples to be processed per coordinates. If the accrual time of these factors exceeds the batch delay time, the

accrual time dominates. Batch delay time starts when the pen touch initiates the scan function that converts

coordinates.

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