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TMDS171 Datasheet(PDF) 8 Page - Texas Instruments

Part # TMDS171
Description  TMDS171/I 3.4 Gbps TMDS RETIMER
PDF  63 Pages
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Manufacturer  TI2 [Texas Instruments]
Direct Link  https://www.ti.com
Logo TI2 - Texas Instruments

TMDS171 Datasheet(HTML) 8 Page - Texas Instruments

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TMDS171, TMDS171I
SLLSEN7E – OCTOBER 2015 – REVISED SEPTEMBER 2017
www.ti.com
Product Folder Links: TMDS171
Submit Documentation Feedback
Copyright © 2015–2017, Texas Instruments Incorporated
(1)
ICC is a direct result of the source design as the TMDS171 integrated receive termination resistor accounts for 85 mA to 100 mA.
(2)
IDD is impacted by ARC usage. Connecting a 500 KΩ resistor to GND at SPDIF reduces the value by more than 20 mA.
(3)
The measurements were made with no active source connected.
6.5 Electrical Characteristics
The Maximum rating is simulated at 3.465 V VCC and 1.27 V VDD and at 85°C temperature. The Typical rating is simulated at
3.3 VCC and 1.2 V VDD and at 27°C temperature (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Power Supply
P(D1)
(1) (2)
Device power Dissipation
(Retimer Operation)
OE = H, VCC = 3.3 V / 3.465 V, VDD = 1.2 V / 1.27 V
IN_Dx: VID_PP = 1200 mV, I2C_EN/PIN = L, PRE_SEL= H,
EQ_CTL= H, SDA_CTL/CLK_CTL = 0 V
3.4 Gbps TMDS pattern, VI = 3.3 V; VSADJ = 7.06 kΩ
675
875
mW
P(D2)
(1) (2)
Device power Dissipation
(Redriver Operation)
400
600
mW
P(SD1)
(1) (2) (3)
Device power in Standby
OE = H, VCC = 3.3 V / 3.465 V
VDD = 1.2 V / 1.27 V , HPD = H,
No Valid input Signal
50
100
mW
P(SD2)
(1) (2) (3)
Device power in PowerDown
OE = L, VCC = 3.3 V / 3.465 V
VDD = 1.2 V / 1.27 V
10
30
mW
ICC1
(1) (2)
VCC Supply current (TMDS 3.4
Gpbs Retimer Mode)
OE = H, VCC = 3.3 V / 3.465 V
VDD = 1.2 V / 1.27 V
IN_Dx: VID_PP = 1200 mV,
3.4 Gbps TMDS pattern I2C_EN/PIN = L, PRE_SEL = H,
EQ_CTL = H, SDA_CTL/CLK_CTL = 0 V, SLEW_CTL = H
80
140
mA
IDD1
(1) (2)
VDD Supply current (TMDS 3.4
Gpbs Retimer Mode)
286
325
mA
ICC2
(1) (2)
VCC Supply current (TMDS 3.4
Gpbs Redriver Mode)
OE = H, VCC = 3.3 V / 3.465 V
VDD = 1.2 V / 1.27 V
IN_Dx: VID_PP = 1200 mV,
3.4 Gbps TMDS pattern I2C_EN/PIN = L, PRE_SEL = H,
EQ_CTL = H, SDA_CTL/CLK_CTL = 0V, SLEW_CTL = H
51
mA
IDD2
(1) (2)
VDD Supply current (TMDS 3.4
Gpbs Redriver Mode)
188
mA
I(SD1)
(3)
Standby current
OE = H, VCC = 3.3 V / 3.465 V
VDD = 1.2 V / 1.27 V
HPD = H: No valid signal on
IN_CLK
3.3V Rail(1)
6
15
mA
1.2V Rail
40
50
I(SD2)
(3)
PowerDown current
OE = L, VCC = 3.3 V / 3.465 V
VDD = 1.2 V / 1.27 V
3.3V Rail(1)
2
5
mA
1.2V Rail
3.5
15
TMDS Differential Input
D(R_RX_DATA)
TMDS data lanes data rate
0.25
3.4
Gbps
D(R_RX_CLK)
TMDS clock lanes clock rate
25
340
MHz
tRX_DUTY
Input clock duty circle
40%
50%
60%
tCLK_JIT
Input clock jitter tolerance
0.3
Tbit
tDATA_JIT
Input data jitter tolerance
Test the TTP2 See Figure 11
150
ps
tRX_INTRA
Input intra-pair skew tolerance
Test at TTP2 when DR = 1.6 Gbps See Figure 11
112
ps
tRX_INTER
Input inter-pair skew tolerance
1.8
ns
EQH(D)
Fixed EQ gain for data lane
IN_D(0,1,2)n/p
EQ_SEL/A0=H; Fixed EQ gain, test at 3.4 Gbps
14
dB
EQL(D)
Fixed EQ gain for data lane
IN_D(0,1,2)n/p
EQ_SEL/A0=L; Fixed EQ gain, test at 3.4 Gbps
7.5
EQZ(D)
Adaptive EQ gain for data lane
IN_D(0,1,2)n/p
EQ_SEL/A0=NC; adaptive EQ
2
14
EQ(C)
EQ gain for clock lane
IN_CLKn/p
EQ_SEL/A0=H,LNC
0
R(INT)
Input differential termination
impedance
90
100
115
Ω
TMDS Differential Output
VOH
Single-ended high level output
voltage
PRE_SEL = NC; TX_TERM_CTL = H; OE = H; DR = 750
Mbps; VSadj = 7.06 kΩ
VCC -
10mV
VCC +
10mV
V
PRE_SEL = NC; TX_TERM_CTL = H; OE = NC; DR = 2.97
Gbps; VSadj = 7.06 kΩ
VCC -
200mV
VCC +
10mV
VOL
Single-ended low level output
voltage No Pre-emphasis,
Load is 50 Ω pull ups to 3.135
V and 3.465 V
PRE_SEL = NC; TX_TERM_CTL = H; OE = H; DR = 750
Mbps; VSadj = 7.06 kΩ
VCC -
600mV
VCC -
400mV
PRE_SEL = NC; TX_TERM_CTL = H; OE = NC; DR = 2.97
Gbps; VSadj = 7.06 kΩ
VCC -
700mV
VCC -
400mV



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