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TMDS171 Datasheet(PDF) 8 Page - Texas Instruments |
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TMDS171 Datasheet(HTML) 8 Page - Texas Instruments |
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8 / 63 page ![]() 8 TMDS171, TMDS171I SLLSEN7E – OCTOBER 2015 – REVISED SEPTEMBER 2017 www.ti.com Product Folder Links: TMDS171 Submit Documentation Feedback Copyright © 2015–2017, Texas Instruments Incorporated (1) ICC is a direct result of the source design as the TMDS171 integrated receive termination resistor accounts for 85 mA to 100 mA. (2) IDD is impacted by ARC usage. Connecting a 500 KΩ resistor to GND at SPDIF reduces the value by more than 20 mA. (3) The measurements were made with no active source connected. 6.5 Electrical Characteristics The Maximum rating is simulated at 3.465 V VCC and 1.27 V VDD and at 85°C temperature. The Typical rating is simulated at 3.3 VCC and 1.2 V VDD and at 27°C temperature (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT Power Supply P(D1) (1) (2) Device power Dissipation (Retimer Operation) OE = H, VCC = 3.3 V / 3.465 V, VDD = 1.2 V / 1.27 V IN_Dx: VID_PP = 1200 mV, I2C_EN/PIN = L, PRE_SEL= H, EQ_CTL= H, SDA_CTL/CLK_CTL = 0 V 3.4 Gbps TMDS pattern, VI = 3.3 V; VSADJ = 7.06 kΩ 675 875 mW P(D2) (1) (2) Device power Dissipation (Redriver Operation) 400 600 mW P(SD1) (1) (2) (3) Device power in Standby OE = H, VCC = 3.3 V / 3.465 V VDD = 1.2 V / 1.27 V , HPD = H, No Valid input Signal 50 100 mW P(SD2) (1) (2) (3) Device power in PowerDown OE = L, VCC = 3.3 V / 3.465 V VDD = 1.2 V / 1.27 V 10 30 mW ICC1 (1) (2) VCC Supply current (TMDS 3.4 Gpbs Retimer Mode) OE = H, VCC = 3.3 V / 3.465 V VDD = 1.2 V / 1.27 V IN_Dx: VID_PP = 1200 mV, 3.4 Gbps TMDS pattern I2C_EN/PIN = L, PRE_SEL = H, EQ_CTL = H, SDA_CTL/CLK_CTL = 0 V, SLEW_CTL = H 80 140 mA IDD1 (1) (2) VDD Supply current (TMDS 3.4 Gpbs Retimer Mode) 286 325 mA ICC2 (1) (2) VCC Supply current (TMDS 3.4 Gpbs Redriver Mode) OE = H, VCC = 3.3 V / 3.465 V VDD = 1.2 V / 1.27 V IN_Dx: VID_PP = 1200 mV, 3.4 Gbps TMDS pattern I2C_EN/PIN = L, PRE_SEL = H, EQ_CTL = H, SDA_CTL/CLK_CTL = 0V, SLEW_CTL = H 51 mA IDD2 (1) (2) VDD Supply current (TMDS 3.4 Gpbs Redriver Mode) 188 mA I(SD1) (3) Standby current OE = H, VCC = 3.3 V / 3.465 V VDD = 1.2 V / 1.27 V HPD = H: No valid signal on IN_CLK 3.3V Rail(1) 6 15 mA 1.2V Rail 40 50 I(SD2) (3) PowerDown current OE = L, VCC = 3.3 V / 3.465 V VDD = 1.2 V / 1.27 V 3.3V Rail(1) 2 5 mA 1.2V Rail 3.5 15 TMDS Differential Input D(R_RX_DATA) TMDS data lanes data rate 0.25 3.4 Gbps D(R_RX_CLK) TMDS clock lanes clock rate 25 340 MHz tRX_DUTY Input clock duty circle 40% 50% 60% tCLK_JIT Input clock jitter tolerance 0.3 Tbit tDATA_JIT Input data jitter tolerance Test the TTP2 See Figure 11 150 ps tRX_INTRA Input intra-pair skew tolerance Test at TTP2 when DR = 1.6 Gbps See Figure 11 112 ps tRX_INTER Input inter-pair skew tolerance 1.8 ns EQH(D) Fixed EQ gain for data lane IN_D(0,1,2)n/p EQ_SEL/A0=H; Fixed EQ gain, test at 3.4 Gbps 14 dB EQL(D) Fixed EQ gain for data lane IN_D(0,1,2)n/p EQ_SEL/A0=L; Fixed EQ gain, test at 3.4 Gbps 7.5 EQZ(D) Adaptive EQ gain for data lane IN_D(0,1,2)n/p EQ_SEL/A0=NC; adaptive EQ 2 14 EQ(C) EQ gain for clock lane IN_CLKn/p EQ_SEL/A0=H,LNC 0 R(INT) Input differential termination impedance 90 100 115 Ω TMDS Differential Output VOH Single-ended high level output voltage PRE_SEL = NC; TX_TERM_CTL = H; OE = H; DR = 750 Mbps; VSadj = 7.06 kΩ VCC - 10mV VCC + 10mV V PRE_SEL = NC; TX_TERM_CTL = H; OE = NC; DR = 2.97 Gbps; VSadj = 7.06 kΩ VCC - 200mV VCC + 10mV VOL Single-ended low level output voltage No Pre-emphasis, Load is 50 Ω pull ups to 3.135 V and 3.465 V PRE_SEL = NC; TX_TERM_CTL = H; OE = H; DR = 750 Mbps; VSadj = 7.06 kΩ VCC - 600mV VCC - 400mV PRE_SEL = NC; TX_TERM_CTL = H; OE = NC; DR = 2.97 Gbps; VSadj = 7.06 kΩ VCC - 700mV VCC - 400mV |
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