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7721 Datasheet(PDF) 560 Page - Renesas Technology Corp |
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7721 Datasheet(HTML) 560 Page - Renesas Technology Corp |
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560 / 577 page ![]() 7721 Group User’s Manual 17–97 Appendix 11. Electrical characteristics APPENDIX DMAC switching characteristics (VCC = 5 V ±10 %, VSS = 0 V, Ta = –20 to 85 °C, f(XIN) = 25 MHz, unless otherwise noted) Note: The limits depend on f(XIN). Table 6 lists calculation formulas for the limits. Limits tsu(DRQ-φ1) tw(DRQ) td(φ1–STi) td(φ1–DAK) td(AL–E) td(E–DHQ) tpxz(E–DHZ) td(AM–E) td(E–DLQ) tpxz(E–DLZ) td(AH–E) td(ALE–E) tw(ALE) td(BHE–E) td(BLE–E) td(R/W–E) th(E–AL) th(ALE–AM) th(E–DHQ) tpzx(E–DHZ) th(E–AM) th(ALE–AH) th(E–DLQ) tpzx(E–DLZ) th(E–BHE) th(E–BLE) th(E–R/W) tw(EL) td(data) td(φ1–TC) tw(TC) tsu(TCIN) tw(TCIN) ________ DMAREQi input setup time ________ DMAREQi input pulse width ST0, ST1 output delay time ________ DMAACKi output delay time Address low-order output delay time Data high-order output delay time (BYTE = “L”) Data high-order floating start delay time (BYTE = “L”) Address middle-order output delay time Data low-order output delay time Data low-order floating start delay time Address high-order output delay time ALE output delay time ALE pulse width ____ BHE output delay time ____ BLE output delay time __ R/W output delay time Address low-order hold time Address middle-order hold time (BYTE = “L”) Data high-order hold time (BYTE = “L”) Data high-order floating release delay time (BYTE = “L”) Address middle-order hold time (BYTE = “H”) Address high-order hold time Data low-order hold time Data low-order floating release delay time ____ BHE hold time ____ BLE hold time __ R/W hold time __ E pulse width Copy delay time ___ TC output delay time ___ TC output pulse width ___ TC input setup time ___ TC input pulse width Max. Parameter Symbol Min. 60 80 15 15 4 22 20 20 20 18 9 18 20 18 9 18 20 18 18 18 55 50 50 60 80 Unit ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns 40 60 35 0 35 0 (Note) (Note) (Note) (Note) (Note) (Note) (Note) (Note) (Note) (Note) (Note) (Note) (Note) (Note) (Note) (Note) (Note) (Note) 50 Note: Figures 13 and 14 show the test circuits. |
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