LMX2433 datasheet(16/53 Pages) TI1

16 / 53 page

LMX2430, LMX2433, LMX2434

SNAS187D – FEBRUARY 2003 – REVISED JANUARY 2016

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Bench Test Setups (continued)

the RF_R/ 2 frequency word (MUX[3:0] word = 14) or the IF_R/ 2 frequency word (MUX[3:0] word = 12) in

CodeLoader. A universal counter is connected to the Ftest/LD pin and is used to monitor the output frequency of

the reference divider. The expected frequency must be the signal generator frequency divided by twice the

corresponding counter value, that is, 2000. The factor of two comes in because the LMX243x device has an

internal /2 circuit which is used to provide a 50% duty cycle.

In a similar way, sensitivity is typically measured over frequency, supply voltage and temperature. In order to

perform the measurement, the temperature, frequency, and supply voltage is set to a fixed value and the power

level (voltage level) of the signal at OSCin is varied. Sensitivity is reached when the frequency error of the

divided input signal is greater than or equal to 1 Hz.

8.1.5 LMX243x FinRF Input Impedance Test Setup

Figure 27. Imput Impedance Test Setup

Notes:

DATA is clocked into the 24-bit shift register on the rising edge of CLK

The MSB of DATA is shifted in first.

Figure 28. LMX243x Serial Data Input Timing

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LMX2433 Datasheet(PDF) 16 Page - Texas Instruments