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MCP19124 Datasheet(PDF) 21 Page - Microchip Technology |
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MCP19124 Datasheet(HTML) 21 Page - Microchip Technology |
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21 / 236 page ![]() 2016 Microchip Technology Inc. DS20005619A-page 21 MCP19124/5 3.10 OV REF This reference is dual purposed and can be used to set the voltage regulation set point or the output overvoltage set point. By default this reference is connected to the noninverting input of the voltage error amplifier (EA2). When the voltage error amplifier is disabled by setting the EA2DIS bit in the ABECON register, this reference is connected to the noninverting input of the over voltage comparator. Here this reference is compared to the VS input pin, which is typically proportional to the output voltage based on an external resistor divider. OV protection, when enabled, can be set to a value for the protection of system circuitry or it can be used to “ripple” regulate the converter output voltage for repositioning purposes. The comparator output triggers a configurable interrupt such that firmware can take any additional desired action. 3.11 Independent Gate Drive with Programmable Delay Two independent low-side gate drives are integrated for synchronous applications. Programmable delay has been implemented to improve efficiency and prevent shoot-through currents. Each gate drive has an independent enable input controlled by the PE1 register and programmable dead time controlled by the DEADCON register. 3.12 Temperature Management 3.12.1 THERMAL SHUTDOWN To protect the MCP19124/5 from overtemperature conditions, a 150°C junction temperature thermal shutdown has been implemented. When the junction temperature reaches this limit, the device disables the output drivers. In Shutdown mode, both PDRV and SDRV outputs are disabled and the overtemperature flag (OTIF) is set in the PIR2 register. When the junction temperature is reduced by 20°C to 130°C, the MCP19124/5 can resume normal output drive switching. 3.12.2 TEMPERATURE REPORTING The MCP19124/5 have a second on-chip temperature monitoring circuit that can be read by the ADC through the analog test MUX. Refer to Section 25.0 “Internal Temperature Indicator Module” for details on this internal temperature monitoring circuit. |
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