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CS5530A Datasheet(PDF) 253 Page - National Semiconductor (TI) |
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CS5530A Datasheet(HTML) 253 Page - National Semiconductor (TI) |
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253 / 259 page ![]() Revision 1.1 253 www.national.com 6.0 Test Mode Information The CS5530A provides two test modes: 1) The NAND tree test mode for board-level automatic test equipment (ATE). 2) The I/O test mode for system design testing. 6.1 NAND TREE TEST MODE The NAND tree mode is used to test input and bidirectional pins which will be part of the NAND tree chain. Table 6-1 shows how to set the device for the NAND tree test. The output of the NAND tree is multiplexed on the SUSP# output (pin K26). After a POR# (pin K24) pulse, all inputs in Table 6-2 on page 254 are initialized to a “1” and then are successively pulled and held to a “0” starting with SUSP_3V (the first input pin in the tree). The output wave- form on SUSP# will toggle on each input change as shown in Figure 6-1. POR# is included as an input during the NAND Tree test, after being used to trigger the test first. IRQ7 (pin AD14) and TEST (pin D3) must be held high throughout the test. Figure 6-1. NAND Tree Output Waveform Table 6-1. NAND Tree Test Selection Signal Name Pin No. Setting POR# K24 0 -> 1 TEST D3 1 IRQ7 AD14 1 Initial Conditions: TEST = 1, IRQ7 = 1, POR# = (first 0, then 1), all inputs ‘1’ SUSP_3V SUSPA# PSERIAL CLK_14MHZ SUSP# (out) NAND Tree Inputs . . . NAND Tree Output Example: Beginning of NAND Tree Test Sequence The following pins are not in the NAND tree: AEN, BALE, CPU_RST, DACK[3:0]#, DACK[7:5]#, DCLK, DDC_SCL, D+_PORT1, D–_PORT1, D+_PORT2, D–_PORT2, EXTVREFIN, FP_CLK, FP_CLK_EVEN, FP_DISP_ENA_OUT, FP_ENA_BKL, FP_ENA_VDD, FP_HSYNC_OUT, FP_VSYNC_OUT, GPCS#, GPORT_CS#, HSYNC_OUT, IDE_ADDR[2:0], IDE_CS[1:0]#, IDE_DACK[1:0]#, IDE_IOR[1:0]#, IDE_IOW[1:0]#, IDE_RST#, IOUTB, IOUTG, IOUTR, IREF, IRQ7, ISACLK, KBROMCS#, PC_BEEP, PCI_RST#, PLLTEST, SA_LATCH, SDATA_OUT, SMEMR#/RTCALE, SMEMW#/RTCCS#, SUSP#, SYNC, TEST, VID_RDY, VSYNC_OUT, all NCs, and all analog/digi- tal supplies. |
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