TMP117 datasheet(5/45 Pages) TI1

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TMP117

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SNOSD82 – JUNE 2018

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Electrical Characteristics (continued)

minimum and maximum specifications are over -55°C to 150°C and V+ = 1.8 V to 5.5 V (unless otherwise noted); typical

specifications are at TA = 25°C and V+ = 3.3 V.

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

(4)

Hysteresis is defined as the ability to reproduce a temperature reading as the temperature varies from room

→ hot

→room→cold→room. The temperatures used for this test are -40°C, 25°C, and 150°C.

(5)

Quiescent current between conversions

Temperature cycling and

hysteresis(4)

8 Averages

±1

LSB

DIGITAL INPUT/OUTPUT

Input capacitance

VIH

Input logic high level

0.7 (V+)

VIL

Input logic low level

0.3 (V+)

IIN

Input current

-0.1

0.1

μA

VOLS

SDA output logic low level

IOL = -3 mA

0.4

VOLA

ALERT output logic low level

IOL = -3 mA

0.4

POWER SUPPLY

Quiescent current

Active Conversion, serial bus inactive

135

220

μA

Quiescent current

Duty cycle 1 Hz, averaging mode off, serial bus

inactive

3.5

4.5

μA

Duty cycle 1 Hz, 8 avgerages mode, serial bus

inactive

Duty cycle 1 Hz, averaging mode off, serial bus

active, SCL frequency = 400 kHz

ISB

Stanby current(5)

Serial bus inactive, SCL and SDA = V+

1.25

2.1

μA

ISD

Shutdown current

Serial bus inactive, SCL and SDA = V+, 25°C

0.15

0.5

μA

Serial bus inactive, SCL and SDA = V+, 125°C

μA

Serial bus active, SCL frequency = 400 kHz

μA

IEE

EEPROM write quiescent

current

ADC conversion off; serial bus inactive

240

μA

VPOR

Power-on-reset threshold

voltage

Supply going up

1.6

Brownout detect

Supply going down

1.1

Reset Time

Time required by device to reset

1.5

Conversion time

One-shot mode

13.5

15.5

6.6 Switching Characteristics

minimum and maximum specifications are over -55°C to 150°C and V+ = 1.8 V to 5.5 V (unless otherwise noted) typical

specifications are at TA = 25°C and V+ = 3.3 V.

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

EEPROM

Programming time

Number of writes

1,000

50,000

Times

Data retention time

100

Years

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