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SC3200 Datasheet(PDF) 85 Page - Advanced Micro Devices |
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SC3200 Datasheet(HTML) 85 Page - Advanced Micro Devices |
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85 / 447 page ![]() AMD Geode™ SC3200 Processor Data Book 85 Signal Definitions Revision 5.1 SDTEST5 AH3 D28 O Memory Internal Test Signals. These sig- nals are used for internal testing only. For normal operation, these signals should be programmed as one of their muxed options. GPIO6+ DTR2#/BOUT2+ IDE_IOR1# SDTEST4 AJ2 C31 O GPIO8+CTS2#+ IDE_DREQ1 SDTEST3 AJ4 E28 O SIN2 SDTEST2 AG4 C28 O GPIO9+DCD2#+ IDE_IOW1# SDTEST1 AJ1 B29 O GPIO10+DSR2# +IDE_IORDY1 SDTEST0 AH4 C30 O GPIO7+RTS2#+ IDE_DACK1# TDP AH5 D30 I/O Thermal Diode Positive / Negative. These signals are for internal testing only. For nor- mal operation leave unconnected. --- TDN AL3 D31 I/O --- 3.4.19 Test and Measurement Interface Signals (Continued) Signal Name Ball No. Type Description Mux EBGA TEPBGA |
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