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33389 Datasheet(PDF) 15 Page - Freescale Semiconductor, Inc |
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33389 Datasheet(HTML) 15 Page - Freescale Semiconductor, Inc |
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15 / 49 page ![]() Analog Integrated Circuit Device Data Freescale Semiconductor 15 33389 ELECTRICAL CHARACTERISTICS DYNAMIC ELECTRICAL CHARACTERISTICS BUS TRANSMITTER (CONTINUED) AC Failure 4, 7, and 8 Recovery Time Bus Normal Mode tAC478R 10 — 60 µs AC Failure 3, 4, and 7 Detection Time Bus Stand-by Mode, VBAT = 12 V tAC347D 0.8 — 8.0 ms AC Failure 3, 4 and 7 Recovery Time Bus Stand-by Mode, VBAT = 12 V tAC347R — 2.5 — ms AC Edge Count Difference Between CANH/CANL for Failures 1, 2, 5 Detection Bus Normal Mode CAN125D — 3.0 — — AC Edge Count Difference Between CANH/CANL for Failures 1, 2, 5 Recovery Bus Normal Mode CAN125R — 3.0 — — TX Permanent Dominant Timer Disable Time Bus Normal and Failure Modes tTXD 0.75 — 4.0 ms POWER INPUT TIMING V1 Reset Delay Time tD 2.0 — 20 µs V1 Line Regulation 9.0 V < VBAT < 16.5, ILOAD = 10 mA tD -15 2.0 +15 mV V1 Line Regulation 5.5 V < VBAT < 27 V ILOAD = 10 mA tD -50 10 +50 mV V1 Load Regulation 1.0 mA < ILOAD < 100 mA tD -50 — +50 mV V1 Line Ripple Rejection 100 Hz, 1.0 VPP on VBAT = 12 V, ILOAD = 100 mA (12) tD 30 55 — dB V1 Line Transient Response VBAT from 12 V to 40 V in 1.0 µs, (10 µF, ESR = 3 Ω) tD — 27 — mV V1 Load Transient Response ILOAD from 10 µA to 100 mA in 1.0 µs (CLOAD = 10 µF, ESR = 3 Ω) (13) tD — 400 — mV V1 Load Transient Response ILOAD from 10 µA to 100 mA in 1.0 µs (CLOAD = 10 µF, ESR= 0.1 Ω) tD — 16 — mV Notes 12. Guaranteed by design. Not production tested. 13. This condition does not produce a reset Table 5. Dynamic Electrical Characteristics (continued) Characteristics noted under conditions 7.0 V ≤ V SUP ≤ 18 V, - 40°C ≤ T A ≤ 125°C, GND = 0 V unless otherwise noted. Typical values noted reflect the approximate parameter means at TA = 25°C under nominal conditions unless otherwise noted. Characteristic Symbol Min Typ Max Unit |
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