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SLRC400 Datasheet(PDF) 113 Page - NXP Semiconductors

Part # SLRC400
Description  I쨌CODE Reader IC
PDF  130 Pages
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Manufacturer  PHILIPS [NXP Semiconductors]
Direct Link  http://www.nxp.com
Logo PHILIPS - NXP Semiconductors

SLRC400 Datasheet(HTML) 113 Page - NXP Semiconductors

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Philips Semiconductors
Product Specification Rev. 2.0 November 2001
I
•CODE Reader IC
SL RC400
113
Preliminary
18.3
Analog Test-Signals
The analog test signals may be routed to pin AUX by selecting them with the register bits TestAnaOutSel.
Value
Signal Name
Description
0
Vmid
Voltage at internal node Vmid
1
Vbandgap
Internal reference voltage generated by the band gap.
2
VRxFollI
Output signal from the demodulator using the I-clock.
3
VRxFollQ
Output signal from the demodulator using the Q-clock.
4
VRxAmpI
I-channel subcarrier signal amplified and filtered.
5
VRxAmpQ
Q-channel subcarrier signal amplified and filtered.
6
VCorrNI
Output signal of N-channel correlator fed by the I-channel subcarrier
signal.
7
VCorrNQ
Output signal of N-channel correlator fed by the Q-channel subcarrier
signal.
8
VCorrDI
Output signal of D-channel correlator fed by the I-channel subcarrier
signal.
9
VCorrDQ
Output signal of D-channel correlator fed by the Q-channel subcarrier
signal.
A
VEvalL
Evaluation signal from the left half bit.
B
VEvalR
Evaluation signal from the right half bit.
C
VTemp
Temperature voltage derived from band gap.
D
RFU
Reserved for future use
E
RFU
Reserved for future use
F
RFU
Reserved for future use
Table 18-2: Analog Test Signal Selection



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