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SLRC400 Datasheet(PDF) 112 Page - NXP Semiconductors |
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SLRC400 Datasheet(HTML) 112 Page - NXP Semiconductors |
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112 / 130 page ![]() Philips Semiconductors Product Specification Rev. 2.0 November 2001 I •CODE Reader IC SL RC400 112 Preliminary 18 TEST SIGNALS 18.1 General The SL RC400 allows different kind of signal measurements. These measurements can be used to check the internally generated and received signals using the possibilities of the serial signal switch as described in chapter 15. Furthermore, with the SL RC400 the user may select internal analog signals to measure them at pin AUX and internal digital signals to observe them on pin SIGOUT by register selections. These measurements can be helpful during the design-in phase to optimise the receiver’s behaviour or for test purpose. 18.2 Measurements Using the Serial Signal Switch Using the serial signal switch at pin SIGOUT the user may observe data send to the label or data received from the label. The following tables give an overview of the different signals available. SignalToSIGOUT SIGOUTSelect Signal routed to SIGOUT pin 0 0 LOW 0 1 HIGH 0 2 Envelope 0 3 Transmit NRZ 0 4 Manchester with Subcarrier 0 5 Manchester 0 6 RFU 0 7 RFU 1 X Digital Test signal Table 18-1 Signal routed to SIGOUT pin |
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