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PC87591L Datasheet(PDF) 377 Page - National Semiconductor (TI) |
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PC87591L Datasheet(HTML) 377 Page - National Semiconductor (TI) |
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377 / 437 page ![]() 7.0 Device Specifications (Continued) Revision 1.07 377 www.national.com 7.3 INTERNAL RESISTORS DC Test Conditions Notes: 1. The equivalent resistance of the pull-up resistor is calculated by RPU = (VSUP − VPIN) / IPU. 2. The equivalent resistance of the pull-down resistor is calculated by RPD = VPIN / IPD. 7.3.1 Pull-Up Resistor Symbol: PUnn 7.3.2 Pull-Down Resistor Symbol: PDnn Symbol Parameter Conditions Typical Min Max Unit RPU 1 1. Not tested; guaranteed by characterization. Pull-up equivalent resistance VPIN =0V nn nn – 34% nn + 47% K Ω VPIN = 0.17 VDD nn – 44% K Ω VPIN = 0.8 VDD nn – 41% K Ω Symbol Parameter Conditions Typical Min Max Unit RPD 1 1. Not tested; guaranteed by characterization. Pull-down equivalent resistance VPIN =VDD nn nn – 35% nn + 60% K Ω VPIN = 0.17 VDD nn – 37% K Ω VPIN = 0.8 VDD nn – 48% K Ω Device Under Test RPU Pull-Up Resistor Test Circuit Pull-Down Resistor Test Circuit VSUP Pin A IPU V VPIN Device Under Test RPD VSUP Pin A IPD V VPIN VSUP Figure 123. Internal Resistor Test Conditions, TA =0°Cto70°C, VSUP = 3.3V |
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