AR0141CS datasheet(39/64 Pages) ONSEMI

39 / 64 page

AR0141CS/D Rev. 6, 4/16 EN

©Semiconductor Components Industries, LLC, 2016.

AR0141CS: 1/4-Inch Digital Image Sensor

Changing Sensor Modes

Test Patterns

The AR0141CS has the capability of injecting a number of test patterns into the top of

the datapath to debug the digital logic. With one of the test patterns activated, any of the

datapath functions can be enabled to exercise it in a deterministic fashion. Test patterns

are selected by Test_Pattern_Mode register (R0x3070). Only one of the test patterns can

be enabled at a given point in time by setting the Test_Pattern_Mode register according

to Table 17. When test patterns are enabled the active area will receive the value speci-

fied by the selected test pattern and the dark pixels will receive the value in Test_Pat-

tern_Green (R0x3074 and R0x3078) for green pixels, Test_Pattern_Blue (R0x3076) for

blue pixels, and Test_Pattern_Red (R0x3072) for red pixels. The noise pedestal offset at

as 0x0000 for normal test pattern output.

Solid Color

When the color field mode is selected, the value for each pixel is determined by its color.

Green pixels will receive the value in Test_Pattern_Green, red pixels will receive the value

in Test_Pattern_Red, and blue pixels will receive the value in Test_Pattern_Blue.

Vertical Color Bars

When the vertical color bars mode is selected, a typical color bar pattern will be sent

through the digital pipeline.

Walking 1s

When the walking 1s mode is selected, a walking 1s pattern will be sent through the

digital pipeline. The first value in each row is 1.

Table 17:

Test Pattern Modes

Test_Pattern_Mode

Test Pattern Output

No test pattern (normal operation)

Solid color test pattern

100% Vertical Color Bars test pattern

Fade-to-Gray Vertical Color Bars test pattern

256

Walking 1s test pattern (12-bit)

AR0141CS Datasheet(PDF) 39 Page - ON Semiconductor