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SPC584BX Datasheet(PDF) 52 Page - STMicroelectronics |
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SPC584BX Datasheet(HTML) 52 Page - STMicroelectronics |
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52 / 142 page ![]() Electrical characteristics SPC584Bx 52/142 DS11701 Rev 4 TUE12 CC D TUE degradation due to VDD_HV_ADR offset with respect to VDD_HV_ADV VIN < VDD_HV_ADV VDD_HV_ADR VDD_HV_ADV [0:25 mV] –1 1 LSB (12b) VIN < VDD_HV_ADV VDD_HV_ADR VDD_HV_ADV [25:50 mV] –2 2 VIN < VDD_HV_ADV VDD_HV_ADR VDD_HV_ADV [50:75 mV] –4 4 VIN < VDD_HV_ADV VDD_HV_ADR VDD_HV_ADV [75:100 mV] –6 6 VDD_HV_ADV < VIN < VDD_HV_ADR VDD_HV_ADR VDD_HV_ADV [0:25 mV] –2.5 2.5 VDD_HV_ADV < VIN < VDD_HV_ADR VDD_HV_ADR VDD_HV_ADV [25:50 mV] –4 4 VDD_HV_ADV < VIN < VDD_HV_ADR VDD_HV_ADR VDD_HV_ADV [50:75 mV] –7 7 VDD_HV_ADV < VIN < VDD_HV_ADR VDD_HV_ADR VDD_HV_ADV [75:100 mV] –12 12 DNL(8) CC P Differential non- linearity Standard frequency mode, VDD_HV_ADV > 4 V VDD_HV_ADR_S > 4 V –1 2 LSB (12b) T High frequency mode, VDD_HV_ADV > 4 V VDD_HV_ADR_S > 4 V –1 2 1. Minimum ADC sample times are dependent on adequate charge transfer from the external driving circuit to the internal sample capacitor. The time constant of the entire circuit must allow the sampling capacitor to charge within 1/2 LSB within the sampling window. Refer to Figure 8 for models of the internal ADC circuit, and the values to use in external RC sizing and calculating the sampling window duration. 2. Mode1: 6 sampling cycles + 10 conversion cycles at 13.33 MHz. 3. Mode2: 5 sampling cycles + 10 conversion cycles at 13.33 MHz. 4. Mode3: 6 sampling cycles + 10 conversion cycles at 16 MHz. 5. IADCREFH and IADCREFL are independent from ADC clock frequency. It depends on conversion rate: consumption is driven by the transfer of charge between internal capacitances during the conversion. 6. Current parameter values are for a single ADC. Table 26. SARn ADC electrical specification (continued) Symbol C Parameter Conditions Value Unit Min Max |
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