MA780 – 8-BIT TO 12-BIT LOW-POWER ANGLE SENSOR

MA780 Rev. 1.2

MonolithicPower.com

4

8/30/2021

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ELECTRICAL CHARACTERISTICS

VDD = 3.3V, B = 45mT to 100mT, TA = -40°C to +125°C, unless otherwise noted.

Parameter

Symbol

Condition

Min

Typ

Max

Units

Supply Current

Active supply current

IACTIVE

10

12.5

mA

Idle supply current

IIDLE

Below 85°C

0.3

1.9

µA

Absolute Output

– Serial

Effective resolution

±

3σ deviations from the noise

distribution

8

12

bits

Noise RMS

1σ from the noise distribution

0.015

0.2

deg

Refresh rate

Active mode

850

980

1100

kHz

Data output length

16

16

bits

Response Time

VDD power-up time

After setting VDD at 3.3V

600

µs

Start-up time

tSTART_UP

From active to data valid while FW = 0

35

µs

Latency (4)

Constant speed propagation delay

during tACTIVE, equals the FW time

constant (

������) + 3µs

4

4000

µs

Filter cutoff frequency (4)

fCUTOFF

Depends on FW

39

160000

Hz

128MHz internal high

freq CLK error (affects

TACT & filter settling

time)

At room temperature

-13

+12

%

Cycle time accuracy

At room temperature

-5

+5

%

Accuracy

INL at 25°C

At room temperature across the full

field range

0.7

deg

INL between -40°C to

+125°C (5)

Across the full temperature range and

field range

1.1

deg

Output Drift

Temperature-induced

drift at room temp (5)

0.01

deg/°C

Temperature-induced

variation (5)

From 25°C to 85°C

0.5

deg

From 25°C to 125°C

0.7

deg

Induced magnetic field (5)

0.01

deg/mT

Induced supply voltage (5)

0.35

deg/V

Digital I/O

Input high voltage (5)

VIH

VDDIO = 3.3V

2.5

5.5

V

VDDIO = 1.8V

1.2

5.5

V

Input low voltage (5)

VIL

VDDIO = 3.3V

-0.3

+0.8

V

VDDIO = 1.8V

-0.3

+0.4

V

Output low voltage (5)

VOL

IOL = 4mA, VDDIO = 3.3V

0.4

V

IOL = 4mA, VDDIO = 1.8V

0.4

V

Output high voltage (5)

VOH

IOL = 4mA, VDDIO = 3.3V

2.4

V

IOL = 4mA, VDDIO = 1.8V

1.2

V

Falling edge slew rate (4)

tF

CL = 50pF

0.7

V/ns

Notes:

4) Guaranteed by design.

5) Guaranteed by characteristic testing.