6.9 Electrical Characteristics

Over free-air temperature range and VDD = 3.1V to 34V (unless otherwise noted)

Typical specifications are at TA = 25°C and VDD = 3.3V (unless otherwise noted)

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

TEMPERATURE SENSOR

TERR

Temperature accuracy

TA = 25°C

±0.5

°C

TA = 0°C to 70°C

–2.0

2.0

TA = –40°C to 150°C

–3.0

3.0

TLTD

Long-term stability and drift(1)

1000 hours at TA = 150°C

±0.25

°C

TGAIN

Sensor sensitivity (gain)

TA = –40°C to 150°C

10

mV/°C

VOUT

Output voltage

TA = 0°C

500

mV

TA = 25°C

750

TA = 30°C

800

TNL

Output nonlinearity

TA = –40°C to 150°C

–0.8

0.8

°C

τ63_D

Thermal response time

(directional)

2-layer 62-mil PCB

2oz. Copper

T63%

TSTEP = 25°C to 75°C

3.7

s

τ63_L

Thermal response time

(stirred liquid)

2-layer 62-mil PCB

0.5in × 0.5in

T63%

TSTEP = 25°C to 150°C

2

τ63_A

Thermal response time

(still air)

2-layer 62-mil PCB

0.5in × 0.5in

T63%

TSTEP = 25°C to 75°C

123

ANALOG OUTPUT

VOUTR

Output voltage range

TA = –40°C to 150°C

100

2000

mV

ZOUT

Output impedance

ILOAD = 0μA to 100μA, f = 0Hz to 1kHz

90

Ω

IOUT

Output current

VOUT source current

100

μA

VOUT sink current

1

IOUT-SC

Output short-circuit current

limit

VOUT short-circuit source current

0.75

5

mA

VOUT short-circuit sink current

60

90

μA

CMTI

Common-mode transient

immunity

VDD = 5V, VCM = 750V, tPULSE = 10μs

CLOAD = 1nF, ILOAD = 50μA, ΔVOUT < 200mV

65.8

kV/μs

REGLI

Line regulation

3.1V ≤ VDD ≤ 34V

–1.2

1.2

mV/V

REGLD Load regulation

ILOAD = 0μA to 100μA

9

mV

CLOAD

Capacitive load drive

RISO = 0Ω

Phase margin ≥ 45°

2.2

nF

RISO ≥ 300Ω

Unlimited

POWER SUPPLY

IQ

Quiescent current

TA = 25°C, VDD = 3.3V

45

65

μA

TA = –40°C to 150°C

140

VON-TH

Turn-on threshold voltage

TA = –40°C to 150°C

2.1

2.8

V

VOFF-TH Turn-off threshold voltage

TA = –40°C to 150°C

1.7

2.1

V

tON

Turn-on time

CLOAD = 0pF

25

µs

PSRR

Power supply rejection ratio

TA = 25°C

VDD = 3.3V

f = 1kHz

–75

dB

f = 100kHz

–45

f = 1MHz

–25

(1)

Long term stability and drift is determined using accelerated operational life testing at a junction temperature of 150°C.

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ISOTMP35R

SNIS244A – SEPTEMBER 2025 – REVISED MAY 2026

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