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AT697E Datasheet(PDF) 28 Page - ATMEL Corporation

Part # AT697E
Description  Rad-Hard 32 bit SPARC V8 Processor
PDF  154 Pages
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Manufacturer  ATMEL [ATMEL Corporation]
Direct Link  http://www.atmel.com
Logo ATMEL - ATMEL Corporation

AT697E Datasheet(HTML) 28 Page - ATMEL Corporation

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27
AT697
4226G–AERO–05/09
Write
The write policy for stores is write-through with no-allocate on write-miss. The write buf-
fer (WRB) consists of three 32-bit registers used to temporarily hold store data until it is
sent to the destination device. For half-word or byte stores, the stored data replicated
into proper byte alignment for writing to a word-addressed device, before being loaded
into one of the WRB registers.
The WRB is emptied prior to a load-miss cache-fill sequence to avoid any stale data
from being read in to the data cache.
Read
On a data cache read-miss to a cachable location, 4 bytes of data are loaded into the
cache from main memory.
Cache Flush
Data cache can be flushed by executing the FLUSH instruction, setting logical one the
flush data cache bit (FD) in the cache control register, or writing any location with
ASI=0x6. The flush operation takes one cycle per line during which the IU will is not
halted, but during which the cache is disabled. When the flush operation is completed,
the cache will resume the state indicated in the cache control register.
Error Reporting
Since the processor executes in parallel with the write buffer, a write error will not cause
an exception to the store instruction. Depending on memory and cache activity, the write
cycle may not occur until several clock cycles after the store instructions has completed.
If a write error occurs, the currently executing instruction will take trap 0x2B.
Note:
the 0x2B trap handler should flush the data cache, since a write hit would update the
cache while the memory would keep the old value due the write error.
If a memory access error occurs during a data load, the corresponding valid bit in the
cache tag will not be set. and a data access error trap (tt=0x09) is generated.
Data Cache Parity
Error detection of cache tags and data is implemented using two parity bits per tag and
per 4-byte data sub-block. The tag parity is generated from the tag value and the valid
bits. The data parity is derived from the sub-block data. The parity bits are written simul-
taneously with the associated tag or sub-block and checked on each access. The two
parity bits correspond to the parity of odd and even data (tag) bits.
If a tag parity error is detected during a cache access, a cache miss is generated. The
tag and the data are automatically updated. All valid bits except the one corresponding
to the newly loaded data are cleared. Each error is reported in the instruction cache tag
error counter from the CCR. The data cache tag error counter (DTE) is incremented
after each data cache tag error detection.
If a data sub-block parity error occurs, a miss is also generated but only the failed sub-
block is updated with data from main memory. Each error is reported in the data cache
data error counter from the CCR. The data cache data error counter (DDE) is incre-
mented after each data cache data error detection.
Data Cache Snooper
In addition to the cache controller, a snooper is implemented on the on-chip cache sub-
system. The cache snooper is enabled setting logical one the snoop enable bit (DS) in
the cache control register.
This snooper is able to verify if a master on the internal bus accesses and modifies
some cached data. If a master accesses a data in memory and this data is cached, the
snooper will invalidate the corresponding cache tag. Next time the IU will access the
modified data, a cache miss will be generated due to not valid tag.



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