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PC87383 Datasheet(PDF) 17 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
Part # PC87383
Description  Legacy-Reduced SuperI/O with Fast Infrared Port, Serial Port, Parallel Port and GPIOs for Portable Applications
PDF  77 Pages
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Manufacturer  NSC [National Semiconductor (TI)]
Direct Link  http://www.national.com
Logo NSC - National Semiconductor (TI)

PC87383 Datasheet(HTML) 17 Page - National Semiconductor (TI)

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Bit 4 (read only) of the CLOCKCF register is the Valid Clock Generator status bit. While stabilizing, the output clock is frozen
to a steady logic level, and the status bit is cleared to 0 to indicate a frozen clock. When the clock generator is stable, the
output clock starts toggling and the status bit is set to 1. The status bit tells the software when the Clock Generator is ready.
The software should poll this status bit until it is set (1), and only then activate the UART and the Infrared interface.
The clock generator and its output clock do not consume power when they are disabled.
2.3.3
Chip Power-Up
To ensure proper operation, proceed as follows after power-up:
1. Set bit 5 of the Clock Generator Control register (CLOCKCF) at Index 29h according to the clock source used; see
Table 5.
2. Enable the clock. If the clock source is 14.31818 MHz:
— Poll bit 4 of the CLOCKCF register while the clock generator is stabilizing.
— When bit 4 of CLOCKCF is set to 1, go to step 3.
3. Enable any module in the chip, as needed.
Table 5. Clock Generator Encoding Options
2.3.4
Specifications
Wake-up time is 33 msec (maximum). This is measured from the time the Clock Generator is enabled until the clock is stable.
Note: The reference clock must be stable at the time the Clock Generator is enabled. Tolerance (long term deviation) of the
generator
output
clock,
relative
to
the
input
clock,
is
±110 ppm. Total tolerance is therefore
± (input clock tolerance + 110 ppm).
2.4
TESTABILITY SUPPORT
The PC87383 supports two testability modes:
• In-Circuit Testing (ICT)
• XOR Tree Testing
2.4.1
ICT
The In-Circuit Testing (ICT) technique, also known as “bed-of-nails”, injects logic patterns to the input pins of the devices
mounted on the tested board. It then checks their outputs for the correct logic levels.
The PC87383 supports this testing technique by floating (putting in TRI-STATE) all the device pins. This prevents “back-
driving” the PC87383 pins by the ICT tester when a device normally controlled by PC87383 is tested (device inputs are driv-
en by the ICT tester).
2.4.2
XOR Tree Testing
When the PC87383 is mounted on a board, it can be tested using the XOR Tree technique. This test also checks the correct
connection of the device pins to the board.
In XOR Tree mode, all PC87383 pins are configured as inputs, except the last pin in the tree, which is the XOR_OUT output.
The buffer type of the input pins participating in the XOR tree is INT (Input, TTL compatible), regardless of the buffer type of
these pins in normal device operation mode (see Section 1.3 on page 10). The input pins are chained through XOR gates,
as shown in Figure 2. The Not Connected, power and ground pins (NC, VDD, VSS, VCORF) are excluded from the XOR
tree.
CLKIN Pin Frequency
CLOCKCF Bit 5
48 MHz
0
14.31818 MHz
1



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