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PC8374L Datasheet(PDF) 138 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
Part # PC8374L
Description  SensorPathTM SuperI/O with Glue Functions
PDF  239 Pages
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Manufacturer  NSC [National Semiconductor (TI)]
Direct Link  http://www.national.com
Logo NSC - National Semiconductor (TI)

PC8374L Datasheet(HTML) 138 Page - National Semiconductor (TI)

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8.0 Health Management (HM) (Continued)
www.national.com
138
Revision1.1
8.2.9
Event Notification
Event Notification for SMBus Access
The Status Registers 1-3 (see Section 8.5.23 on page 164) contain status bits for the following events:
• Device 1 (LM96011 or LM96010 or LM96012) communication error (DEV1_Fault)
• Device 2 (LM95010) communication error (DEV2_Fault)
• Device 1 (LM96011 or LM96010 or LM96012) Remote Diode fault (RD_Fault)
• Fan failure for the four tachometer inputs (FAN4_STALL-FAN1_STALL)
• Temperature above the critical limit for the three temperature zones (CRIT3_ERR-CRIT1_ERR)
• Temperature outside the low or high limit for the three temperature zones (ZONE3_ERR-ZONE1_ERR)
• Voltage outside the low or high limit for the five voltage channels (5V_ERR, 3.3V_ERR, Vccp_ERR, 2.5V_ERR,
12V_ERR)
When a status bit is set, updated it is disabled, thus preserving its value until the corresponding status register is read via
the SMBus. Reading the register re-enables status bit updating with the current event state.
Figure 35. Event Notification for SMBus
Event Notification for LPC Access
The HM Interrupt Status Registers 1-3 (see Section 8.4.4 on page 143) contains event status bits for the following events:
• Device 1 (LM96011 or LM96010 or LM96012) communication changes state between working and not-working
(DEV1_EV).
• Device 2 (LM95010) communication changes state between working and not-working (DEV2_EV).
• Device 1 (LM96011 or LM96010 or LM96012) Remote Diode fault changes state between no-fault and fault (RD_EV).
• Tachometer inputs change state between fans running and failed (FAN4_EV-FAN1_EV).
• Temperature zones change state between below and above the critical limit (CRIT3_EV-CRIT1_EV).
• Temperature zones change state between working within limits and exceeding limits (ZONE3_EV-ZONE1_EV).
• Voltage channels change state between working within limits and exceeding limits (5V_EV, 3.3V_EV, Vccp_EV,
2.5V_EVR, 12V_EV).
Note that whenever a state changes these LPC event status bits are set.
These bits can generate an IRQ to the host if the corresponding enable bits are set in the HM Interrupt Enable Registers 1-
3 (see Section 8.4.6 on page 145). The HM Interrupt Enable Registers 1-3 are reset by a VDD Power-Up reset, a Hardware
reset or a Software reset.
The actual state of each event is held by the corresponding bits in the HM Sensor Status Registers 1-3 (see Section 8.4.8
on page 147).
SCI and SMI Event Routing
All the event status bits in the HMINT_STS1-3 registers (see Section 8.4.4 on page 143) can be divided into two different
groups, based on the severity that each status represents:
• Limit Events: 2.5V_EV, Vccp_EV, 3.3V_EV, 5V_EV, ZONE1_EV, ZONE2_EV and ZONE3_EV of HMINT_STS1 regis-
ter, 12V_EV of HMINT_STS2 register.
• Critical Events: FAN1-4_EV, RD_EV, DEV1_EV, DEV2_EV of HMINT_STS2 register, CRIT1-3_EV of HMINT_STS3
register.
Each of these groups can be routed independently, via the control bits of the Events to SMI/SCI Routing register (see
Section 8.4.16 on page 152), to generate an SCI (SIOPME) interrupt or an SMI interrupt. The enable bits in the HM SMI/SCI
Enable Register 1-3 (see Section 8.4.13 on page 150) enable SMI/SCI generation based on the value of the corresponding
event status bit. The SMI and SCI are generated via the SWC module.
SMBus
Interface
Status
From Other Status Bits
Event State
Disable
SMBus
Event
Bit
Update
Control
Enable
Read Register
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