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CS48L32 Datasheet(PDF) 8 Page - Cirrus Logic |
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CS48L32 Datasheet(HTML) 8 Page - Cirrus Logic |
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8 / 192 page ![]() 8 Cirrus Logic DS1219F4 CS48L32 3 Characteristics and Specifications 3 Characteristics and Specifications Table 3-1 defines parameters as they are characterized in this section. Table 3-1. Parameter Definitions Parameter Definition Channel separation Left-to-right and right-to-left channel separation is the difference in level between the active channel (driven to maximum full scale output) and the measured signal level in the idle channel at the test signal frequency. The active channel is configured and supplied with an appropriate input signal to drive a full scale output, with signal measured at the output of the associated idle channel. Common-mode rejection ratio (CMRR) The ratio of a specified input signal (applied to both sides of a differential input), relative to the output signal that results from it. Power-supply rejection ratio (PSRR) The ratio of a specified power supply variation relative to the output signal that results from it. PSRR is measured under quiescent signal path conditions. Signal-to-noise ratio (SNR) A measure of the difference in level between the maximum full scale output signal and the output with no input signal applied. Total harmonic distortion (THD) The ratio of the RMS sum of the harmonic distortion products in the specified bandwidth 1 relative to the RMS amplitude of the fundamental (i.e., test frequency) output. 1.All performance measurements are specified with a 20 kHz, low-pass brick-wall filter and, where noted, an A-weighted filter. The low-pass filter removes out-of-band noise. Total harmonic distortion plus noise (THD+N) The ratio of the RMS sum of the harmonic distortion products plus noise in the specified bandwidth 1 relative to the RMS amplitude of the fundamental (i.e., test frequency) output. Table 3-2. Absolute Maximum Ratings Absolute maximum ratings are stress ratings only. Permanent damage to the device may be caused by continuously operating at or beyond these limits. Device functional operating limits and guaranteed performance specifications are given under electrical characteristics at the test conditions specified. Parameter Symbol Minimum Maximum Supply voltages VDD_D [1], VDD_FLL [1] VDD_A, VDD_CP VDD_IO 1.The VDD_D and VDD_FLL pins should be tied to a common supply rail. The associated power domain is referred to as VDD_D. –0.3 V –0.3 V –0.3 V 1.52 V 2.27 V 4.32 V Voltage range digital inputs VDD_IO domain INn_PDMDATA — — VGND_SUB – 0.3 V VGND_SUB – 0.3 V VVDD_IO + 0.3 V VVOUT_MIC + 0.3 V Voltage range analog inputs IN1xx_n VGND_SUB – 0.3 V VVOUT_MIC + 0.3 V Ground 2 2.On the QFN package variant, all of the CS48L32 ground domains are connected to the exposed die pad. GND_A, GND_D, GND_CP VGND_SUB – 0.3 V VGND_SUB + 0.3V Operating temperature range TA –40ºC +85ºC Operating junction temperature TJ –40ºC +125ºC Storage temperature after soldering — –65ºC +150ºC ESD-sensitive device. The CS48L32 is manufactured on a CMOS process. It is therefore generically susceptible to damage from excessive static voltages. Proper ESD precautions must be taken during handling and storage of this device. This device is qualified to current JEDEC ESD standards. |
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