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PM7347 Datasheet(PDF) 249 Page - PMC-Sierra, Inc |
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PM7347 Datasheet(HTML) 249 Page - PMC-Sierra, Inc |
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249 / 341 page ![]() S/UNI®-JET Data Sheet Released Proprietary and Confidential to PMC-Sierra, Inc., and for its Customers’ Internal Use 249 Document ID: PMC-1990267, Issue 3 12 Test Features Description The test mode registers, shown in Table 27, are used for production and board testing. During production testing, the test mode registers are used to apply test vectors. In this case, the test mode registers (as opposed to the normal mode registers) are selected when A[10] is high. During board testing, the digital output pins and the data bus are held in a high-impedance state by simultaneously asserting (low) the CSB, RDB, and WRB inputs. All of the TSBs for the S/UNI-JET are placed in test mode 0 so that device inputs may be read and device outputs may be forced through the microprocessor interface. Refer to the section "Test Mode 0" for details. Note: The S/UNI-JET supports a standard IEEE 1149.1 five-signal JTAG boundary scan test port that can be used for board testing. All digital device inputs may be read and all digital device outputs may be forced through this JTAG test port. Table 27 Test Mode Register Memory Map Address Register 000H-3FFH Normal Mode Registers 400H Master Test Register 708H SPLR Test Register 0 709H SPLR Test Register 1 70AH SPLR Test Register 2 70BH Reserved 70CH SPLT Test Register 0 70DH SPLT Test Register 1 70EH SPLT Test Register 2 70FH SPLT Test Register 3 710H PMON Test Register 0 711H PMON Test Register 1 712H-71FH Reserved 720H CPPM Test Register 0 721H CPPM Test Register 1 722H CPPM Test Register 2 723H-72FH Reserved 730H DS3 FRMR Test Register 0 731H DS3 FRMR Test Register 1 732H DS3 FRMR Test Register 2 733H DS3 FRMR Test Register 3 734H DS3 TRAN Test Register 0 735H DS3 TRAN Test Register 1 736H DS3 TRAN Test Register 2 |
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