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DIX9211 Datasheet(PDF) 2 Page - Texas Instruments |
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DIX9211 Datasheet(HTML) 2 Page - Texas Instruments |
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2 / 110 page  DIX9211 SBAS519 – SEPTEMBER 2010 www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. PACKAGE/ORDERING INFORMATION(1) OPERATING PACKAGE TEMPERATURE PACKAGE ORDERING TRANSPORT MEDIA, PRODUCT PACKAGE-LEAD DESIGNATOR RANGE MARKING NUMBER QUANTITY DIX9211PT Tray, 250 DIX9211 LQFP-48 PT –40°C to +85°C DIX9211 DIX9211PTR Tape and Reel, 1000 (1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the device product folder on www.ti.com. ABSOLUTE MAXIMUM RATINGS (1) Over operating free-air temperature range (unless otherwise noted). DIX9211 UNIT Supply voltage VCC, VDD, VDDRX –0.3 to +4.0 V Supply voltage differences: VCC, VDD ±0.1 V Ground voltage differences: AGND, DGND, GNDRX ±0.1 V RXIN2, RXIN3, RXIN4/ASCKI0, RXIN5/ABCKI0, RXIN6/ALRCKI0, –0.3 to +6.5 V RXIN7/ADIN0, MC/SCL, MDI/SDA, MDO/ADR, MS/ADR1, RST MPIO_A0-A3, MPIO_B0-B3, MPIO_C0-C3 –0.3 to +6.5 V Digital input voltage RXIN0, RXIN1 (For S/PDIF TTL / OPTICAL input) –0.3 to +6.5 V MODE –0.3 to +4.0 V RXIN0, RXIN1 (For S/PDIF Coaxial Input Only) –0.3 to (VDDRX + 0.3) < +4.0 V Analog input voltage XTI, XTO –0.3 to (VDD + 0.3) < +4.0 V FILT –0.3 to (VCC + 0.3) < +4.0 V Input current (any pins except supplies) ±10 mA Ambient temperature under bias –40 to +125 °C Storage temperature –55 to +150 °C Junction temperature +150 °C Package temperature (reflow, peak) +260 °C (1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. 2 Submit Documentation Feedback Copyright © 2010, Texas Instruments Incorporated Product Folder Link(s): DIX9211 |
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