AM625 datasheet(90/276 Pages) TI2

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6.2 ESD Ratings for Devices which are not AEC - Q100 Qualified

VALUE

UNIT

V(ESD)

Electrostatic discharge

(ESD)

Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1)

±1000

Charged-device model (CDM), per ANSI/ESDA/JEDEC JS-002(2)

±250

(1)

JEDEC document JEP155 states that 500V HBM allows safe manufacturing with a standard ESD control process.

(2)

JEDEC document JEP157 states that 250V CDM allows safe manufacturing with a standard ESD control process.

6.3 ESD Ratings for AEC - Q100 Qualified Devices

VALUE

UNIT

V(ESD)

Electrostatic discharge

Human-body model (HBM), per AEC - Q100-002(1)

±1000

Charged-device model (CDM), per AEC - Q100-011

Corner pins ALW

package

(A1, A25, AE1, and

AE25)

±750

Corner pins AMC

package

(A1, A21, AA1, and

AA21)

All other pins

±250

(1)

AEC - Q100-002 indicates that HBM stressing shall be in accordance with the ANSI/ESDA/JEDEC JS-001 specification.

6.4 Power-On Hours (POH)

POWER ON HOURS (POH)(1) (2) (3)

JUNCTION TEMPERATURE RANGE (TJ)

LIFETIME (POH)

Commercial

0°C to 95°C

100000

Extended Industrial

–40°C to 105°C

100000

Automotive

–40°C to 125°C

20000(4)

(1)

This information is provided solely for your convenience and does not extend or modify the warranty provided under TI's standard

terms and conditions for TI semiconductor products.

(2)

Unless specified in the table above, all voltage domains and operating conditions are supported in the device at the noted

temperatures.

(3)

POH is a function of voltage, temperature and time. Usage at higher voltages and temperatures will result in a reduction in POH.

(4)

Automotive profile is defined as 20000 power on hours with a junction temperature as follows: 5%@-40°C, 65%@70°C, 20%@110°C,

and 10%@125°C.

AM625, AM625-Q1, AM623, AM620-Q1

SPRSP58C – JUNE 2022 – REVISED OCTOBER 2025

www.ti.com

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Product Folder Links: AM625 AM625-Q1 AM623 AM620-Q1

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