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32186 Datasheet(PDF) 896 Page - Renesas Technology Corp

Part # 32186
Description  MCU
PDF  1032 Pages
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Manufacturer  RENESAS [Renesas Technology Corp]
Direct Link  http://www.renesas.com
Logo RENESAS - Renesas Technology Corp

32186 Datasheet(HTML) 896 Page - Renesas Technology Corp

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JTAG
21
21-2
32185/32186 Group Hardware Manual
Rev.1.10 REJ09B0235-0110 May 15, 07
21.1 Outline of JTAG
21.1 Outline of JTAG
The M32R/ECU contains a JTAG (Joint Test Action Group) interface compliant with IEEE Standard Test
Access Port and Boundary-Scan Architecture (IEEE Std. 1149.1a-1993). This JTAG interface can be used
as an input/output path for boundary-scan test (boundary-scan path). For details about IEEE 1149.1 JTAG
test access ports, see IEEE Std. 1149.1a-1993 documentation.
Note: • The JTAG interface in the M32R/ECU is used to connect a JTAG emulator during debugging as
well. In this chapter, the JTAG interface is explained assuming its use as an input/output path
for boundary-scan test.
Functions of the JTAG interface-related pins mounted on the M32R/ECU are shown below.
Table 21.1.1 JTAG Pin Functions
Type
Pin Name Signal Name
I/O
Function
TAP
JTCK
Test clock
Input
Clock input to the test circuit.
(Note 1) JTDI
Test data Input
Input
Synchronous serial data input pin used to supply the test instruction
code and test data.
This input is sampled on the rising edge of JTCK.
JTDO
Test data Output Output
Synchronous serial data output pin used to output the test instruction
code and test data. This signal changes state on the falling edge of JTCK,
and is output in only the Shift-IR or Shift-DR state. Otherwise, it goes to a
high-impedance state.
JTMS
Test mode select Input
Test mode select input to control the test circuit’s state transition. This input is
sampled on the rising edge of JTCK.
JTRST
Test reset
Input
Active "L" test reset input to initialize the test circuit asynchronously. To
ensure that the test circuit is reset without fail, JTMS input signal must be
held "H" while this signal changes state from "L" to "H."
Note 1: TAP stands for Test Access Port (JTAG interface specified in IEEE 1149.1).



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