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AFBR-810BZ Datasheet(PDF) 26 Page - AVAGO TECHNOLOGIES LIMITED |
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AFBR-810BZ Datasheet(HTML) 26 Page - AVAGO TECHNOLOGIES LIMITED |
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26 / 48 page ![]() 26 2. Memory Map Timing Characteristics The following characteristics are defined over the Recommended Operating Conditions unless otherwise noted. Typical values are for Tc = 40°C, Vcc33 = 3.3 V and Vcc25 = 2.5 V. Parameter Symbol Min Typ Max1 Units Reference Flag (including Tx Fault & LOS) Assert Time2 tFLAG ON 100 ms Figure 20, Time from occurrence of condition to IntL assertion, Vout:IntL = Vol Flag (including Tx Fault & LOS) Clear Time2 tFLAG OFF 100 ms Figure 20, Time for clear on read operation, measured from falling SCL edge after stop bit of read transaction, until Vout:IntL = Voh, where IntL is in static mode Channel Disable Assert Time tDIS ON 100 ms Figure 21, Time from write operation, measured from falling edge of SCL after stop bit of write transaction, until channel output falls below 10% of nominal Channel Disable De-assert Time tDIS OFF 300 ms Figure 21, Time from write operation, measured from falling edge of SCL after stop bit of write transaction, until channel output rises above 90% of nominal Mask Assert Time 100 ms Time from write operation, measured from falling edge of SCL after stop bit of write transaction, until associated IntL is inhibited Mask De-assert Time 100 ms Time from write operation, measured from falling edge of SCL after stop bit of write transaction, until associated IntL resumes Volatile Control Assert Time (except Channel Disable) tCNTL ON 100 ms Time from write operation, measured from falling edge of SCL after stop bit of write transaction, until associated control is activated Volatile Control De-assert Time (except Channel Disable) 100 ms Time from write operation, measured from falling edge of SCL after stop bit of write transaction, until associated control is de-activated Control Transition Period tCNTL XP 10 µs Time during the control assert time when signal integrity may be impaired Non-Volatile Control Assert Time 150 ms Time from up to two byte write operation, measured from falling edge of SCL after stop bit of write transaction, until associated control is activated Non-Volatile Control De-assert Time 150 ms Time from up to two byte write operation, measured from falling edge of SCL after stop bit of write transaction, until associated control is de-activated Non-Volatile Control Assert Time 300 ms Time from up to six byte write operation, measured from falling edge of SCL after stop bit of write transaction, until associated control is activated Non-Volatile Control De-assert Time 300 ms Time from up to six byte write operation, measured from falling edge of SCL after stop bit of write transaction, until associated control is de-activated Module Reset Assert Time 100 ms Time from write operation, measured from falling edge of SCL after stop bit of write transaction, until associated reset begins Module Reset De-assert Time 500 ms Time from write operation, measured from falling edge of SCL after stop bit of write transaction, until associated reset is completed and normal operation resumes Notes: 1. Max values are valid where competing TWS traffic is absent. 2. The outputs of affected channels are disabled for incidences of Tx Fault and squelched for Tx LOS and/or Rx LOS. Timing for output fault and squelch assertion and de-assertion are found in the Receiver Electrical and Transmitter Optical Characteristics sections. |
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