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AFBR-810BZ Datasheet(PDF) 26 Page - AVAGO TECHNOLOGIES LIMITED

Part # AFBR-810BZ
Description  Twelve-Channel Transmitter and Receiver Pluggable, Parallel-Fiber-Optic Modules
PDF  48 Pages
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Manufacturer  AVAGO [AVAGO TECHNOLOGIES LIMITED]
Direct Link  http://www.avagotech.com
Logo AVAGO - AVAGO TECHNOLOGIES LIMITED

AFBR-810BZ Datasheet(HTML) 26 Page - AVAGO TECHNOLOGIES LIMITED

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26
2. Memory Map Timing Characteristics
The following characteristics are defined over the Recommended Operating Conditions unless otherwise noted. Typical
values are for Tc = 40°C, Vcc33 = 3.3 V and Vcc25 = 2.5 V.
Parameter
Symbol
Min
Typ
Max1
Units
Reference
Flag (including Tx Fault & LOS)
Assert Time2
tFLAG ON
100
ms
Figure 20, Time from occurrence of condition to IntL
assertion, Vout:IntL = Vol
Flag (including Tx Fault & LOS)
Clear Time2
tFLAG OFF
100
ms
Figure 20, Time for clear on read operation, measured
from falling SCL edge after stop bit of read
transaction, until Vout:IntL = Voh, where IntL
is in static mode
Channel Disable Assert Time
tDIS ON
100
ms
Figure 21, Time from write operation, measured from
falling edge of SCL after stop bit of write transaction,
until channel output falls below 10% of nominal
Channel Disable De-assert Time
tDIS OFF
300
ms
Figure 21, Time from write operation, measured from
falling edge of SCL after stop bit of write transaction,
until channel output rises above 90% of nominal
Mask Assert Time
100
ms
Time from write operation, measured from falling
edge of SCL after stop bit of write transaction, until
associated IntL is inhibited
Mask De-assert Time
100
ms
Time from write operation, measured from falling
edge of SCL after stop bit of write transaction, until
associated IntL resumes
Volatile Control Assert Time
(except Channel Disable)
tCNTL ON
100
ms
Time from write operation, measured from falling
edge of SCL after stop bit of write transaction, until
associated control is activated
Volatile Control De-assert Time
(except Channel Disable)
100
ms
Time from write operation, measured from falling
edge of SCL after stop bit of write transaction, until
associated control is de-activated
Control Transition Period
tCNTL XP
10
µs
Time during the control assert time when signal
integrity may be impaired
Non-Volatile Control Assert Time
150
ms
Time from up to two byte write operation, measured
from falling edge of SCL after stop bit of write
transaction, until associated control is activated
Non-Volatile Control De-assert
Time
150
ms
Time from up to two byte write operation, measured
from falling edge of SCL after stop bit of write
transaction, until associated control is de-activated
Non-Volatile Control Assert Time
300
ms
Time from up to six byte write operation, measured
from falling edge of SCL after stop bit of write
transaction, until associated control is activated
Non-Volatile Control De-assert
Time
300
ms
Time from up to six byte write operation, measured
from falling edge of SCL after stop bit of write
transaction, until associated control is de-activated
Module Reset Assert Time
100
ms
Time from write operation, measured from falling
edge of SCL after stop bit of write transaction, until
associated reset begins
Module Reset De-assert Time
500
ms
Time from write operation, measured from falling
edge of SCL after stop bit of write transaction, until
associated reset is completed and normal operation
resumes
Notes:
1. Max values are valid where competing TWS traffic is absent.
2. The outputs of affected channels are disabled for incidences of Tx Fault and squelched for Tx LOS and/or Rx LOS. Timing for output fault and
squelch assertion and de-assertion are found in the Receiver Electrical and Transmitter Optical Characteristics sections.



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