CDCE62005 datasheet(53/85 Pages) TI1

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6.02

1.76

ADC

SNR

(

)

(

)

total

ADC

CLK

jitter

20 log

jitter

total

SNR

πf jitter

Output

Divider 0

Output

Divider 1

Output

Divider 2

Output

Divider 3

Output

Divider 4

PFD/

/1:/2:HiZ

Prescaler

Feedback

Divider

Input

Divider

Reference

Divider

30.72 MHz

10.00 MHz

122 .88 MHz

491 .52 MHz

245 .76 MHz

30.72 MHz

10 MHz

CDCE62005

www.ti.com

SCAS862F – NOVEMBER 2008 – REVISED JANUARY 2015

Device Functional Modes (continued)

Table 37. Clock Frequencies

CLOCK FREQUENCY

INPUT/OUTPUT

FORMAT

NUMBER

CDCE62005 PORT

COMMENT

10.000 MHz

Input

LVDS

SEC_REF

Low end crystal oscillator

30.72 MHz

Input

LVDS

PRI_REF

Reference from backplane

122.88 MHz

Output

LVDS

SERDES Clock

491.52 MHz

Output

LVPECL

ASIC

245.76 MHz

Output

LVPECL

FPGA

30.72 MHz

Outputs

LVCMOS

ASIC

10.000 MHz

Outputs

LVCMOS

CPU, DSP

Figure 36. CDCE62005 Jitter Cleaner Example

8.4.3.1 Clocking ADCs with the CDCE62005

High-speed analog to digital converters incorporate high input bandwidth on both the analog port and the sample

clock port. Often the input bandwidth far exceeds the sample rate of the converter. Engineers regularly

implement receiver chains that take advantage of the characteristics of bandpass sampling. This implementation

trend often causes engineers working in communications system design to encounter the term clock limited

performance. Therefore, it is important to understand the impact of clock jitter on ADC performance. Equation 14

shows the relationship of data converter signal to noise ratio (SNR) to total jitter.

(14)

Total jitter comprises two components: the intrinsic aperture jitter of the converter and the jitter of the sample

clock:

(15)

With respect to an ADC with N-bits of resolution, ignoring total jitter, DNL, and input noise, the following equation

shows the relationship between resolution and SNR:

(16)

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