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MCP19124 Datasheet(PDF) 149 Page - Microchip Technology |
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MCP19124 Datasheet(HTML) 149 Page - Microchip Technology |
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149 / 236 page ![]() 2016 Microchip Technology Inc. DS20005619A-page 149 MCP19124/5 25.0 INTERNAL TEMPERATURE INDICATOR MODULE The MCP19124/5 devices are equipped with a temperature sensor designed to measure operating temperature of the silicon die. The silicon die temperature range of operation is from -40°C and +125°C. The temperature sensing circuitry typically ranges from -20°C to +125°C. The temperature sensing circuit output is a voltage that is proportional to the silicon die temperature. The output is internally connected to the device Analog to Digital Converter. 25.1 Circuit Operation This internal temperature measurement circuit is always enabled. FIGURE 25-1: TEMPERATURE CIRCUIT DIAGRAM 25.2 Temperature Output The output of the circuit is measured using the internal analog-to-digital converter. Channel 13 is reserved for the temperature circuit output. Refer to Section 19.0 “Analog-to-Digital Converter (ADC) Module” for detailed information. The temperature of the silicon die can be calculated by the ADC measurement by using Equation 25-1. A factory-stored 10-bit ADC value for 30°C is located at address 2084h. The temperature coefficient for this circuit is is typically 14.0mV/°C +/-0.8mV/°C from -20°C to +125°C. Other temperature readings can be calculated from this 30°C mark as shown in Equation 25-1. Equation 25-1 is based on the ADC Reference connected to the AVDD. EQUATION 25-1: SILICON DIE TEMPERATURE ADC MUX VDD ADC CHS bits (ADCON0 register) n VOUT TEMP_DIE( C ADC_READING (counts) ADC_30 C_READING (counts – 3.5(counts/ · C -----------------------------------------------------------------------------------------------------------------------------------------------------30 C + = |
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