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ATXP032 Datasheet(PDF) 2 Page - Dialog Semiconductor |
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ATXP032 Datasheet(HTML) 2 Page - Dialog Semiconductor |
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2 / 113 page ![]() DS-ATXP032–114I–4-2020 DATASHEET ATXP032 EcoXiP™ High Performance Low-Power Octal Flash Features Optimized for eXecute-in-Place (XiP) operations Instant on Reduces average latency for improving CPU performance Enables 40% higher CPU performance than the basic octal SPI protocol High throughput Octal xSPI mode (8-8-8) with dual data rate (DDR) 150 MHz maximum operating frequency in octal DDR mode Up to 300 MBytes per second data rate in octal DDR mode Full JESD251, and JESD216D compatibility Supports SPI modes 0 and 3 Low power dissipation 60 nA ultra-deep power-down current (typical) 4 µA deep power-down current (typical) 20 µA standby current (typical, for SPI Mode) 35 µA standby current (typical, for octal mode) 10 mA active read current (typical @ 66 MHz for SPI Mode @ 1 pF load) 34 mA active read current (typical, @ 133 MHz, for octal mode dual data rate @ 1 pF load) Single voltage operation with range of 1.7V to 1.95V Flexible, optimized erase architecture for code + data storage applications Uniform 4-Kbyte block erase Uniform 32-Kbyte block erase Uniform 64-Kbyte block erase Full chip erase Hardware controlled locking of protected sectors via WP pin 256-byte, One-Time Programmable (OTP) security register 128 bytes factory programmed with unique identifier 128 bytes user programmable Flexible programming Byte/page program (1 to 256 bytes) Single and octal-input byte/page program (1 to 256 bytes) Write-to-buffer and write-buffer-to-memory commands Active status interrupt when program or erase operation has finished Program and erase suspend/resume Power optimized program and erase control Automatic deep power-down or ultra-deep power- down upon the completion of program or erase operation Automatic checking and reporting of program/erase failures Software controlled reset Hardware reset pin JEDEC standard (JESD252) hardware reset JEDEC standard (JEP106AX) manufacturer and device ID read methodology Support for Serial Flash Discoverable Parameters (SFDP) Programmable I/O drive strength Endurance: 100,000 program/erase cycles Data Retention: 20 years Complies with full industrial temperature range -40°C - 85°C for packaged parts -40°C - 105°C for Die Wafer Form (DWF) Industry standard green (Pb/halide-free/RoHS compliant) package options 24-ball BGA 29-ball WLCSP Die Wafer Form (DWF) |
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