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MAC7200 Datasheet(PDF) 933 Page - Freescale Semiconductor, Inc |
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MAC7200 Datasheet(HTML) 933 Page - Freescale Semiconductor, Inc |
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933 / 976 page ![]() MAC7200 Microcontroller Family Reference Manual, Rev. 2 Freescale Semiconductor 855 Chapter 35 Test Controller (PTI) 35.1 Test Controller Introduction The MAC72xx Test Controller (PTI) performs the following tasks: • Implementation of JTAG Test Register 4 • Control of Lockout Recovery sequence 35.1.1 JTAG Test Register (SC4) The SC4 Test Register is directly accessible from the JTAG interface, and includes the following functionality: • JTAG Lockout Recovery • Device ID • Debug Reset • Chip Status • Core Run Control • This register is customer visible The SC4 Test Register can be accessed as follows: Perform a JTAG SCAN_N instruction with the following values: —ID Number = 4 — Register Length = 23 bits — For writes to SC4, the WRITE bit (bit 22) must be set. — For reads from SC4, the WRITE bit (bit 22) must be cleared. The SC4 Test Register contains the following bits: Table 35-1. SC4 Test Register Field Definitions Field Reset Value Function 0 1 Core is running 4:1 n/a Device ID (Read only) 5 0 Reset debug logic 7:6 0 (reserved) 8 n/a Flash Lockout Recovery is complete (Read only) |
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