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MAC7200 Datasheet(PDF) 935 Page - Freescale Semiconductor, Inc |
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MAC7200 Datasheet(HTML) 935 Page - Freescale Semiconductor, Inc |
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935 / 976 page ![]() Test Controller External Pins MAC7200 Microcontroller Family Reference Manual, Rev. 2 Freescale Semiconductor 857 35.1.2 JTAG Lockout Recovery JTAG Lockout Recovery is performed solely in hardware on the MAC72xx. Please refer to Chapter 20, “Boot Assist Module (BAM)” for more details on JTAG Lockout Recovery. 35.2 Test Controller External Pins 35.3 Test Controller Application Usage No further information is required to use the Test Controller. Table 35-3. Test Controller External Pins Signal Description TEST This input only pin is reserved for test. The pin must be tied to VSS in all applications. If this pin is shorted to a VDD supply or left open, the operation of the device will be unpredictable. |
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