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MAC7200 Datasheet(PDF) 938 Page - Freescale Semiconductor, Inc |
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MAC7200 Datasheet(HTML) 938 Page - Freescale Semiconductor, Inc |
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938 / 976 page ![]() ESD Protection and Latch-up Immunity MAC7200 Microcontroller Family Reference Manual, Rev. 2 860 Freescale Semiconductor A.3 ESD Protection and Latch-up Immunity All ESD testing is in conformity with CDF-AEC-Q100 Stress test qualification for Automotive Grade Integrated Circuits. During the device qualification ESD stresses were performed for the Human Body Model (HBM), the Machine Model (MM) and the Charge Device Model (CDM). A device is defined as a failure if after exposure to ESD pulses the device no longer meets the device specification. Complete DC parametric and functional testing is performed per the applicable device specification at room temperature followed by hot temperature, unless specified otherwise. A6 Voltage difference VDDX to VDDA Δ VDDX –0.1 +0.1 V A7 Voltage difference VSSX to VSSA Δ VDDX –0.1 +0.1 V A8 VREF Differential Voltage VRH – VRL -0.3 5.5 V A9 VRH to VDDA Differential Voltage VRH – VDDA-5.5 5.5 V A10 VRL to VSSA Differential Voltage VRL – VSSA -0.3 0.3 V A11 Digital I/O Input Voltage VIN –0.3 +5.5 V A12 XFC, EXTAL, XTAL inputs VILV –0.3 +3.6 V A13 TEST input VTEST –0.3 +5.5 V A14 Instantaneous Maximum Current2 A15 Storage Temperature Range T stg –55 +150 °C 1. The device contains an internal voltage regulator to generate the logic and PLL supply from the I/O supply. The absolute maximum ratings apply when the device is powered from an external source. 2. Input must be current limited to the value specified. To determine the value of the required current-limiting resistor, use the larger of the calculated values using VPOSCLAMP = VDDA + 0.3V and VNEGCLAMP = –0.3 V. Table A-3. ESD and Latch-up Test Conditions Model Description Symbol Value Unit Human Body Series Resistance R1 1500 Ohm Storage Capacitance C 100 pF Number of Pulses per pin positive negative —— 3 3 Table A-2. Absolute Maximum Ratings (Continued) Num Rating Symbol Min Max Unit |
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