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TMS320VC5502 Datasheet(PDF) 31 Page - Texas Instruments |
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TMS320VC5502 Datasheet(HTML) 31 Page - Texas Instruments |
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31 / 189 page ![]() www.ti.com TMS320VC5502 Fixed-Point Digital Signal Processor SPRS166H – APRIL 2001 – REVISED NOVEMBER 2004 Table 2-4. Signal Descriptions (continued) PIN MULTIPLEXED PIN OTHER(2) FUNCTION NAME SIGNAL NAME TYPE(1) The SP2 pin of Serial Port 2 serves one of two functions: GPIO5 or FSX2. The function of the SP2 pin is determined by the state of the GPIO7 pin during reset. SP2 I/O/Z F, M The SP2 pin is set to GPIO5 if GPIO7 is low during reset. The SP2 pin is set to FSX2 if GPIO7 is high during reset. The function of the SP2 pin will be set once the device is taken out of reset (RESET pin transitions from a low to high state). GPIO5. GPIO5 is selected if GPIO7 is low during reset. The GPIO5 signal is GPIO5 I/O/Z G, H configured as input after reset. Frame synchronization pulse for transmitter of McBSP2. FSX2 is selected if FSX2 I/O/Z G, H GPIO7 is high during reset. The FSX2 signal is configured as input after reset. The SP3 pin of Serial Port 2 serves one of two functions: UART.RX or FSR2. The function of the SP3 pin is determined by the state of the GPIO7 pin during reset. SP3 I/O/Z F, M The SP3 pin is set to UART.RX if GPIO7 is low during reset. The SP3 pin is set to FSR2 if GPIO7 is high during reset. The function of the SP3 pin will be set once the device is taken out of reset (RESET pin transitions from a low to high state). UART.RX I UART receive data input. UART.RX is selected if GPIO7 is low during reset. Frame synchronization pulse for receiver of McBSP2. FSR2 is selected if GPIO7 FSR2 I/O/Z G, H is high during reset. The FSR2 signal is configured as input after reset. I2C Pins SCL I/O/Z C, F, M I2C clock bidirectional port. (Open collector I/O) SDA I/O/Z C, F, M I2C data bidirectional port. (Open collector I/O) Timer Pins Input/Output pin for Timer 0. The TIM0 pin can be configured as an output or an input via the Timer Signal Selection Register (TSSR). When configured as an output, the TIM0 pin can signal a pulse or a change of state when the Timer 0 count TIM0 I/O/Z F, G, H, M matches its period. When configured as an input, the TIM0 pin can be used to provide the clock source for Timer 0 (external clock source mode) or it can be used to start/stop the timer from counting (clock gating mode). This pin can also be used as general-purpose I/O. The TIM0 pin is configured as an input after reset. Input/Output pin for Timer 1. The TIM1 pin can be configured as an output or an input via the Timer Signal Selection Register (TSSR). When configured as an output, the TIM1 pin can signal a pulse or a change of state when the Timer 1 count TIM1 I/O/Z F, G, H, M matches its period. When configured as an input, the TIM1 pin can be used to provide the clock source for Timer 1 (external clock source mode) or it can be used to start/stop the timer from counting (clock gating mode). This pin can also be used as general-purpose I/O. The TIM1 pin is configured as an input after reset. Supply Pins VSS S Digital Ground.Dedicated ground for the device. CVDD S Digital Power, + VDD. Dedicated power supply for the core CPU. PVDD S Digital Power, + VDD. Dedicated power supply for the PLL module. NC No Connect DVDD S Digital Power, + VDD. Dedicated power supply for the I/O pins. Test Pins IEEE standard 1149.1 test clock. TCK is normally a free-running clock signal with a 50% duty cycle. The changes on test access port (TAP) of input signals TMS and TDI are clocked into the TAP controller, instruction register, or selected test data TCK I C, J register on the rising edge of TCK. Changes at the TAP output signal (TDO) occur on the falling edge of TCK. Refer to Section 3.18, Notice Concerning TCK, for important information regarding this pin. IEEE standard 1149.1 test data input. Pin with internal pullup device. TDI is TDI I J clocked into the selected register (instruction or data) on a rising edge of TCK. IEEE standard 1149.1 test data output. The contents of the selected register TDO O/Z (instruction or data) are shifted out of TDO on the falling edge of TCK. TDO is in the high-impedance state except when the scanning of data is in progress. IEEE standard 1149.1 test mode select. Pin with internal pullup device. This serial TMS I J control input is clocked into the TAP controller on the rising edge of TCK. Introduction 31 |
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