MPC5673K datasheet(74/147 Pages) NXP

74 / 147 page

MPC5675K Microcontroller Data Sheet, Rev. 8.1

Electrical characteristics

NXP Semiconductors

In case of only narrow band disturbances the maximum of the results will not change. In case of broadband signals the emission

has to be below the limits.

3.6

Electrostatic discharge (ESD) characteristics

Electrostatic discharges (a positive then a negative pulse separated by 1 second) are applied to the pins of each sample according

to each pin combination. The sample size depends on the number of supply pins in the device (3 parts × (n + 1) supply pin).

This test conforms to the AEC-Q100-002/-003/-011 standard.

3.7

Static latch-up (LU)

Two complementary static tests are required on six parts to assess the latch-up performance:

•

A supply over voltage is applied to each power supply pin.

•

A current injection is applied to each input, output and configurable I/O pin.

These tests are compliant with the EIA/JESD 78 IC latch-up standard.

3.8

Power Management Controller (PMC) electrical characteristics

3.8.1

PMC electrical specifications

This section contains electrical characteristics for the PMC.

Table 15. ESD ratings1, 2

1 All ESD testing is in conformity with CDF-AEC-Q100 Stress Test Qualification for Automotive Grade Integrated

Circuits.

2 A device will be defined as a failure if after exposure to ESD pulses the device no longer meets the device

specification requirements. Complete DC parametric and functional testing shall be performed per applicable

device specification at room temperature followed by hot temperature, unless specified otherwise in the device

specification.

No.

Symbol

Parameter

Conditions

Class

Max value3

3 Data based on characterization results, not tested in production.

Unit

1VESD(HBM)

SR Electrostatic discharge

(Human Body Model)

TA =25 °C

conforming to AEC-Q100-002

H1C

2000

2VESD(MM)

SR Electrostatic discharge

(Machine Model)

TA =25 °C

conforming to AEC-Q100-003

200

3VESD(CDM)

SR Electrostatic discharge

(Charged Device Model)

TA =25 °C

conforming to AEC-Q100-011

C3A

750 (corners)

500

Table 16. Latch-up results

No.

Symbol

Parameter

Conditions

Class

Static latch-up class

TA = 125 °C conforming to JESD 78

II level A

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